JPS5712309A - Probe shifting device of coordinate measuring instrument - Google Patents
Probe shifting device of coordinate measuring instrumentInfo
- Publication number
- JPS5712309A JPS5712309A JP8615580A JP8615580A JPS5712309A JP S5712309 A JPS5712309 A JP S5712309A JP 8615580 A JP8615580 A JP 8615580A JP 8615580 A JP8615580 A JP 8615580A JP S5712309 A JPS5712309 A JP S5712309A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- backward
- route
- contact
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/37—Measurements
- G05B2219/37193—Multicoordinate measuring system, machine, cmm
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/37—Measurements
- G05B2219/37207—Verify, probe, workpiece
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/50—Machine tool, machine tool null till machine tool work handling
- G05B2219/50103—Restart, reverse, return along machined path, stop
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/50—Machine tool, machine tool null till machine tool work handling
- G05B2219/50111—Retract tool along path, reengage along same path
Landscapes
- Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Control Of Position Or Direction (AREA)
Abstract
PURPOSE:To facilitate an easy backward shift of a probe from outside and at a point of measurement which cannot be viewed by eyes, by using the same route for both the backword movement and the contact after a contact of the probe. CONSTITUTION:A contact route speed storage circuit 34 stores a prescribed amount of speed of the contact route through which a probe 14 touches an object 12 to be measured. A backward route speed commanding circuit 26 delivers the backward route speed signal 102 by an amount equivalemt to the prescribed backward shift and based on the contact route speed when the probe shifts backward. A reversing circuit 28 reverses the direction signal 104 within the circuit 34. a backward shift trigger circuit 58 supplies the backward shift trigger signal 106 to both circuits 26 and 28 based on the touch signal 100 of the probe 14. Thus the probe 14 is shifted backward from the object 12 along the same route as the contact route after the probe 14 touches the object 12.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8615580A JPS6018001B2 (en) | 1980-06-25 | 1980-06-25 | Coordinate measuring machine probe moving device |
US06/269,888 US4406068A (en) | 1980-06-25 | 1981-06-03 | Probe tracing method and means for coordinate measuring machine |
DE3123801A DE3123801C2 (en) | 1980-06-25 | 1981-06-16 | Device for coordinate measurement of workpieces |
GB8119352A GB2078399B (en) | 1980-06-25 | 1981-06-23 | Coordinate measuring machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8615580A JPS6018001B2 (en) | 1980-06-25 | 1980-06-25 | Coordinate measuring machine probe moving device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5712309A true JPS5712309A (en) | 1982-01-22 |
JPS6018001B2 JPS6018001B2 (en) | 1985-05-08 |
Family
ID=13878845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8615580A Expired JPS6018001B2 (en) | 1980-06-25 | 1980-06-25 | Coordinate measuring machine probe moving device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6018001B2 (en) |
-
1980
- 1980-06-25 JP JP8615580A patent/JPS6018001B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6018001B2 (en) | 1985-05-08 |
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