JPS57111422A - Spectrum measuring device - Google Patents

Spectrum measuring device

Info

Publication number
JPS57111422A
JPS57111422A JP18553380A JP18553380A JPS57111422A JP S57111422 A JPS57111422 A JP S57111422A JP 18553380 A JP18553380 A JP 18553380A JP 18553380 A JP18553380 A JP 18553380A JP S57111422 A JPS57111422 A JP S57111422A
Authority
JP
Japan
Prior art keywords
measuring device
spectrum
slits
beams
spectrum measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18553380A
Other languages
English (en)
Japanese (ja)
Other versions
JPS634650B2 (enrdf_load_stackoverflow
Inventor
Yoshio Amisawa
Kazuo Furusawa
Osamu Akiyama
Michinosuke Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP18553380A priority Critical patent/JPS57111422A/ja
Publication of JPS57111422A publication Critical patent/JPS57111422A/ja
Publication of JPS634650B2 publication Critical patent/JPS634650B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0232—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using shutters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/32—Investigating bands of a spectrum in sequence by a single detector

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP18553380A 1980-12-29 1980-12-29 Spectrum measuring device Granted JPS57111422A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18553380A JPS57111422A (en) 1980-12-29 1980-12-29 Spectrum measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18553380A JPS57111422A (en) 1980-12-29 1980-12-29 Spectrum measuring device

Publications (2)

Publication Number Publication Date
JPS57111422A true JPS57111422A (en) 1982-07-10
JPS634650B2 JPS634650B2 (enrdf_load_stackoverflow) 1988-01-29

Family

ID=16172458

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18553380A Granted JPS57111422A (en) 1980-12-29 1980-12-29 Spectrum measuring device

Country Status (1)

Country Link
JP (1) JPS57111422A (enrdf_load_stackoverflow)

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59135332A (ja) * 1983-01-21 1984-08-03 Union Gijutsu:Kk 分光測光装置
WO1989000280A1 (en) * 1987-07-07 1989-01-12 Beckman Riic Limited Improvements in and relating to spectrophotometers
US4798464A (en) * 1985-02-21 1989-01-17 The Perkin-Elmer Corporation Scanning array spectrophotometer
US4875773A (en) * 1988-05-06 1989-10-24 Milton Roy Company Optical system for a multidetector array spectrograph
US4966458A (en) * 1988-05-06 1990-10-30 Milton Roy Company Optical system for a multidetector array spectrograph
US5283624A (en) * 1989-10-18 1994-02-01 Hitachi, Ltd. Multi-element simultaneous analysis atomic absorption spectroscopy photometer and multi-element simultaneous analytic method
WO1995032408A1 (en) * 1994-05-24 1995-11-30 Renishaw Plc Spectroscopic apparatus
JPH09145477A (ja) * 1995-11-20 1997-06-06 Tokyo Instr:Kk 分光器
WO1997035178A1 (de) * 1996-03-15 1997-09-25 Forschungszentrum Karlsruhe Gmbh Analysensystem
US5903346A (en) * 1996-03-15 1999-05-11 Forschungszentrum Karlsruhe Gmbh Analysis system
US6319705B1 (en) * 1999-03-31 2001-11-20 Shimadzu Corporation Microchip device for electrophoresis
KR20020045432A (ko) * 2000-12-11 2002-06-19 박성근 Ｃｃｄ 소자를 이용한 스펙트럼 장치
JP2009075073A (ja) * 2007-08-31 2009-04-09 Canon Inc 電磁波の分析装置
WO2016101986A1 (de) * 2014-12-22 2016-06-30 Spectro Analytical Instruments Gmbh Gitterspektrometer mit umschaltbarem lichtweg
EP2573529B1 (en) * 2011-09-26 2017-11-15 Raytheon Company Integrated 3-channel gas detection and measurement spectrometer

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59135332A (ja) * 1983-01-21 1984-08-03 Union Gijutsu:Kk 分光測光装置
US4798464A (en) * 1985-02-21 1989-01-17 The Perkin-Elmer Corporation Scanning array spectrophotometer
WO1989000280A1 (en) * 1987-07-07 1989-01-12 Beckman Riic Limited Improvements in and relating to spectrophotometers
US4875773A (en) * 1988-05-06 1989-10-24 Milton Roy Company Optical system for a multidetector array spectrograph
US4966458A (en) * 1988-05-06 1990-10-30 Milton Roy Company Optical system for a multidetector array spectrograph
EP0340915A3 (en) * 1988-05-06 1991-01-02 Milton Roy Company Optical system for a multidetector array spectrograph
US5283624A (en) * 1989-10-18 1994-02-01 Hitachi, Ltd. Multi-element simultaneous analysis atomic absorption spectroscopy photometer and multi-element simultaneous analytic method
WO1995032408A1 (en) * 1994-05-24 1995-11-30 Renishaw Plc Spectroscopic apparatus
JPH09145477A (ja) * 1995-11-20 1997-06-06 Tokyo Instr:Kk 分光器
WO1997035178A1 (de) * 1996-03-15 1997-09-25 Forschungszentrum Karlsruhe Gmbh Analysensystem
US5903346A (en) * 1996-03-15 1999-05-11 Forschungszentrum Karlsruhe Gmbh Analysis system
US6319705B1 (en) * 1999-03-31 2001-11-20 Shimadzu Corporation Microchip device for electrophoresis
KR20020045432A (ko) * 2000-12-11 2002-06-19 박성근 Ｃｃｄ 소자를 이용한 스펙트럼 장치
JP2009075073A (ja) * 2007-08-31 2009-04-09 Canon Inc 電磁波の分析装置
EP2573529B1 (en) * 2011-09-26 2017-11-15 Raytheon Company Integrated 3-channel gas detection and measurement spectrometer
WO2016101986A1 (de) * 2014-12-22 2016-06-30 Spectro Analytical Instruments Gmbh Gitterspektrometer mit umschaltbarem lichtweg

Also Published As

Publication number Publication date
JPS634650B2 (enrdf_load_stackoverflow) 1988-01-29

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