JPS57111026A - Exposure device for electron beam - Google Patents
Exposure device for electron beamInfo
- Publication number
- JPS57111026A JPS57111026A JP55188949A JP18894980A JPS57111026A JP S57111026 A JPS57111026 A JP S57111026A JP 55188949 A JP55188949 A JP 55188949A JP 18894980 A JP18894980 A JP 18894980A JP S57111026 A JPS57111026 A JP S57111026A
- Authority
- JP
- Japan
- Prior art keywords
- irradiation
- data
- pattern
- indexes
- pattern element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55188949A JPS57111026A (en) | 1980-12-26 | 1980-12-26 | Exposure device for electron beam |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55188949A JPS57111026A (en) | 1980-12-26 | 1980-12-26 | Exposure device for electron beam |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57111026A true JPS57111026A (en) | 1982-07-10 |
| JPH023535B2 JPH023535B2 (https=) | 1990-01-24 |
Family
ID=16232729
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55188949A Granted JPS57111026A (en) | 1980-12-26 | 1980-12-26 | Exposure device for electron beam |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57111026A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015002189A (ja) * | 2013-06-13 | 2015-01-05 | 株式会社ニューフレアテクノロジー | マルチ荷電粒子ビーム描画方法及びマルチ荷電粒子ビーム描画装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021020187A1 (ja) * | 2019-07-26 | 2021-02-04 | 知明 久慈 | 医療システム、医療デバイス及び医療プログラム |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5721822A (en) * | 1980-07-16 | 1982-02-04 | Jeol Ltd | Exposing method for electron beam |
-
1980
- 1980-12-26 JP JP55188949A patent/JPS57111026A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5721822A (en) * | 1980-07-16 | 1982-02-04 | Jeol Ltd | Exposing method for electron beam |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015002189A (ja) * | 2013-06-13 | 2015-01-05 | 株式会社ニューフレアテクノロジー | マルチ荷電粒子ビーム描画方法及びマルチ荷電粒子ビーム描画装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH023535B2 (https=) | 1990-01-24 |
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