JPS567594B2 - - Google Patents
Info
- Publication number
- JPS567594B2 JPS567594B2 JP9583676A JP9583676A JPS567594B2 JP S567594 B2 JPS567594 B2 JP S567594B2 JP 9583676 A JP9583676 A JP 9583676A JP 9583676 A JP9583676 A JP 9583676A JP S567594 B2 JPS567594 B2 JP S567594B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
- G01R17/04—Arrangements in which the value to be measured is automatically compared with a reference value in which the reference value is continuously or periodically swept over the range of values to be measured
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
- H04B3/462—Testing group delay or phase shift, e.g. timing jitter
- H04B3/466—Testing attenuation in combination with at least one of group delay and phase shift
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/603,821 US3968427A (en) | 1975-08-11 | 1975-08-11 | Group delay measurement apparatus and method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5221874A JPS5221874A (en) | 1977-02-18 |
JPS567594B2 true JPS567594B2 (ja) | 1981-02-18 |
Family
ID=24417056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51095836A Granted JPS5221874A (en) | 1975-08-11 | 1976-08-11 | Group delay measuring device |
Country Status (4)
Country | Link |
---|---|
US (1) | US3968427A (ja) |
JP (1) | JPS5221874A (ja) |
DE (1) | DE2635016C3 (ja) |
GB (1) | GB1546667A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0351074U (ja) * | 1989-09-22 | 1991-05-17 |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2420769A1 (fr) * | 1978-03-20 | 1979-10-19 | Rai Radiotelevisione Italiana | Procede et dispositif pour mesurer l'amplitude et le retard de groupe sur chaque bande laterale, des bornes d'entree aux bornes de sortie d'un emetteur module en amplitude |
US4301536A (en) * | 1979-12-28 | 1981-11-17 | Bell Telephone Laboratories, Incorporated | Multitone frequency response and envelope delay distortion tests |
JPS585672A (ja) * | 1981-07-01 | 1983-01-13 | Toyo Commun Equip Co Ltd | 絶縁抵抗検出方法 |
JPS58108776A (ja) * | 1981-12-23 | 1983-06-28 | Toshiba Corp | 接合ダイオ−ド |
US4641085A (en) * | 1984-01-09 | 1987-02-03 | Hewlett-Packard Company | Vector network analyzer with integral processor |
US4669051A (en) * | 1984-01-09 | 1987-05-26 | Hewlett-Packard Company | Vector network analyzer with integral processor |
DE3445915C2 (de) * | 1984-01-09 | 1994-09-29 | Hewlett Packard Co | Hochfrequenz-Netzwerkanalysator |
US4635239A (en) * | 1984-05-24 | 1987-01-06 | Phillips Petroleum Company | Data processing |
US4647845A (en) * | 1984-09-20 | 1987-03-03 | Hewlett-Packard Company | Apparatus and method for utilizing an AC detection scalar network analyzer with a CW signal source |
US4683483A (en) * | 1986-05-05 | 1987-07-28 | Burr-Brown Corporation | Subsurface zener diode and method of making |
US4736351A (en) * | 1986-08-28 | 1988-04-05 | Oliver Douglas E | Precision semiconductor device timer |
DE3638458A1 (de) * | 1986-11-11 | 1988-05-26 | Schlumberger Messgeraete Gmbh | Schaltungsanordnung zum bestimmen des frequenzverhaltens eines prueflings |
GB8702804D0 (en) * | 1987-02-07 | 1987-03-11 | Schlumberger Electronics Uk | Frequency response analysis |
JPS63191655U (ja) * | 1988-05-25 | 1988-12-09 | ||
US5399976A (en) * | 1993-02-05 | 1995-03-21 | Hewlett-Packard Company | Group delay estimate system using least square fit to phase response ramp |
DE19904252A1 (de) * | 1999-02-03 | 2000-08-10 | Alcatel Sa | Methode zur Detektion von Verzerrungen sowie Empfänger für verzerrte optische Signale |
WO2002010705A2 (en) * | 2000-08-01 | 2002-02-07 | Wavecrest Corporation | Electromagnetic and optical analyzer |
TW555994B (en) * | 2002-06-12 | 2003-10-01 | Mediatek Inc | Group delay test method and device |
CN100353172C (zh) * | 2002-09-17 | 2007-12-05 | 联发科技股份有限公司 | 群延迟测试方法及装置 |
US7526701B2 (en) * | 2002-10-02 | 2009-04-28 | Mediatek Inc. | Method and apparatus for measuring group delay of a device under test |
US9673914B2 (en) | 2015-08-11 | 2017-06-06 | Keysight Technologies, Inc. | Method and apparatus for spectral stitching using reference channel and a pilot tone |
US9810726B2 (en) | 2015-09-09 | 2017-11-07 | Keysight Technologies, Inc. | Method and system for calibrating phases of comb teeth in comb signal with pilot tone and using calibrated comb teeth phases to measure a device under test |
US9698919B1 (en) | 2015-12-28 | 2017-07-04 | Keysight Technologies, Inc. | Method and apparatus for spectral stitching discontinuous spectra using reference channel, pilot tones and comb signal |
CN107121400B (zh) * | 2017-06-16 | 2023-05-05 | 珠海任驰光电科技有限公司 | 一种伪差分波长调制光纤甲烷气体浓度检测装置及方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1441201A1 (de) * | 1962-10-26 | 1968-10-10 | Siemens AG, Berlin und München, 8000 München | Verfahren zur Messung der absoluten Laufzeit eines Vierpols, insbesondere einer Übertragungsleitung |
US3445762A (en) * | 1963-03-13 | 1969-05-20 | Singer Co | Frequency response testing |
US3384818A (en) * | 1963-12-13 | 1968-05-21 | Bendix Corp | System for detecting and measuring doppler frequency variation in a single pulse of alternating current |
AT264655B (de) * | 1964-05-20 | 1968-09-10 | Tavkoezlesi Ki | Einrichtung zur Messung der Gruppenlaufzeit |
DE2213995B2 (de) * | 1972-03-22 | 1977-08-25 | Frequenzselektive, insbesondere fuer den wobbelbetrieb geeignete messchaltung |
-
1975
- 1975-08-11 US US05/603,821 patent/US3968427A/en not_active Expired - Lifetime
-
1976
- 1976-05-25 GB GB21704/76A patent/GB1546667A/en not_active Expired
- 1976-08-04 DE DE2635016A patent/DE2635016C3/de not_active Expired
- 1976-08-11 JP JP51095836A patent/JPS5221874A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0351074U (ja) * | 1989-09-22 | 1991-05-17 |
Also Published As
Publication number | Publication date |
---|---|
GB1546667A (en) | 1979-05-31 |
DE2635016B2 (de) | 1980-01-17 |
DE2635016C3 (de) | 1983-11-17 |
DE2635016A1 (de) | 1977-05-18 |
US3968427A (en) | 1976-07-06 |
JPS5221874A (en) | 1977-02-18 |