JPS56746B2 - - Google Patents

Info

Publication number
JPS56746B2
JPS56746B2 JP1541372A JP1541372A JPS56746B2 JP S56746 B2 JPS56746 B2 JP S56746B2 JP 1541372 A JP1541372 A JP 1541372A JP 1541372 A JP1541372 A JP 1541372A JP S56746 B2 JPS56746 B2 JP S56746B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1541372A
Other languages
Japanese (ja)
Other versions
JPS496422A (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1541372A priority Critical patent/JPS56746B2/ja
Publication of JPS496422A publication Critical patent/JPS496422A/ja
Publication of JPS56746B2 publication Critical patent/JPS56746B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1541372A 1972-02-14 1972-02-14 Expired JPS56746B2 (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1541372A JPS56746B2 (en:Method) 1972-02-14 1972-02-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1541372A JPS56746B2 (en:Method) 1972-02-14 1972-02-14

Publications (2)

Publication Number Publication Date
JPS496422A JPS496422A (en:Method) 1974-01-21
JPS56746B2 true JPS56746B2 (en:Method) 1981-01-09

Family

ID=11888040

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1541372A Expired JPS56746B2 (en:Method) 1972-02-14 1972-02-14

Country Status (1)

Country Link
JP (1) JPS56746B2 (en:Method)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5069792U (en:Method) * 1973-10-31 1975-06-20
JPS50124168A (en:Method) * 1974-03-02 1975-09-30
JPS5162492A (en) * 1974-10-17 1976-05-31 Toyo Kogyo Co Kensakubanno kirikomiokurisochi
JPS5950943B2 (ja) * 1978-12-11 1984-12-11 沖電気工業株式会社 電子部品の動作試験回路
JPS5643567A (en) * 1979-09-18 1981-04-22 Pioneer Electronic Corp Inspection method of circuit substrate
JPS56148072A (en) * 1980-04-18 1981-11-17 Pioneer Electronic Corp Device for checking circuit substrate
JPS56148074A (en) * 1980-04-19 1981-11-17 Pioneer Electronic Corp Device for checking circuit substrate
JPS56155870A (en) * 1980-05-06 1981-12-02 Pioneer Electronic Corp Inspecting method of circuit substrate including capacitor
JPS56162065A (en) * 1980-05-19 1981-12-12 Pioneer Electronic Corp Checking device for circuit substrate

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3333186A (en) * 1964-08-14 1967-07-25 Burroughs Corp Apparatus having a plurality of pairs of impedance elements for testing electrical wiring connections

Also Published As

Publication number Publication date
JPS496422A (en:Method) 1974-01-21

Similar Documents

Publication Publication Date Title
JPS56746B2 (en:Method)
FR2193152B1 (en:Method)
CS157352B1 (en:Method)
JPS5747645B2 (en:Method)
JPS4953070U (en:Method)
JPS4926863A (en:Method)
JPS4996979U (en:Method)
CS157427B1 (en:Method)
CS159127B1 (en:Method)
JPS4983898A (en:Method)
JPS49101945U (en:Method)
JPS4988648U (en:Method)
CS159942B1 (en:Method)
CS159564B1 (en:Method)
JPS4990769U (en:Method)
CS159538B1 (en:Method)
CS159440B1 (en:Method)
CS159438B1 (en:Method)
CS155397B1 (en:Method)
CS159126B1 (en:Method)
CS158342B1 (en:Method)
CS157816B1 (en:Method)
CS157811B1 (en:Method)
CS155022B1 (en:Method)
CS152734B1 (en:Method)