JPS56162065A - Checking device for circuit substrate - Google Patents

Checking device for circuit substrate

Info

Publication number
JPS56162065A
JPS56162065A JP6617780A JP6617780A JPS56162065A JP S56162065 A JPS56162065 A JP S56162065A JP 6617780 A JP6617780 A JP 6617780A JP 6617780 A JP6617780 A JP 6617780A JP S56162065 A JPS56162065 A JP S56162065A
Authority
JP
Japan
Prior art keywords
check
substrate
positions
check positions
checked
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6617780A
Other languages
Japanese (ja)
Inventor
Takeshi Oami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP6617780A priority Critical patent/JPS56162065A/en
Publication of JPS56162065A publication Critical patent/JPS56162065A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To check a circuit substrate simply, by connecting respective corresponding check positions of the substrate to be checked and of a reference substrate and by applying an AC voltage across both check positions to detect the output level of the connection point. CONSTITUTION:A substrate to be checked and a reference substrate having a standard network are prepared, and swtiches S1-S4 are provided which select respective corresponding to check positions TP0-TPn-1 and TP0'-TPn-1'. For example, when the check positions TP1-TP3 of the substrate to be checked and the check positions TP1'-TP3' of the reference substrate are selected, AC voltage V1 is applied from an oscillator 1 across the check positions TP1-TP3', and AC voltage V0 is taken out from the connection point of both check positions. These voltages are converted to DC voltages by AC-DC converters 2 and 5 and are compared with each other; and if V1=2V0 is true, it is discriminated that there are nothing abnormal about there check points. This operation is repeated successively to check the circuit substrate including a capacitor, etc. simply.
JP6617780A 1980-05-19 1980-05-19 Checking device for circuit substrate Pending JPS56162065A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6617780A JPS56162065A (en) 1980-05-19 1980-05-19 Checking device for circuit substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6617780A JPS56162065A (en) 1980-05-19 1980-05-19 Checking device for circuit substrate

Publications (1)

Publication Number Publication Date
JPS56162065A true JPS56162065A (en) 1981-12-12

Family

ID=13308294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6617780A Pending JPS56162065A (en) 1980-05-19 1980-05-19 Checking device for circuit substrate

Country Status (1)

Country Link
JP (1) JPS56162065A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62280657A (en) * 1986-05-29 1987-12-05 Hitachi Cable Ltd In-line disconnection detector for flat cable

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS496422A (en) * 1972-02-14 1974-01-21
US4129826A (en) * 1977-08-24 1978-12-12 Rca Corporation Circuit test apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS496422A (en) * 1972-02-14 1974-01-21
US4129826A (en) * 1977-08-24 1978-12-12 Rca Corporation Circuit test apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62280657A (en) * 1986-05-29 1987-12-05 Hitachi Cable Ltd In-line disconnection detector for flat cable
JPH0411829B2 (en) * 1986-05-29 1992-03-02 Hitachi Densen Kk

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