JPS5670429A - Measuring device for laser beam - Google Patents
Measuring device for laser beamInfo
- Publication number
- JPS5670429A JPS5670429A JP14740979A JP14740979A JPS5670429A JP S5670429 A JPS5670429 A JP S5670429A JP 14740979 A JP14740979 A JP 14740979A JP 14740979 A JP14740979 A JP 14740979A JP S5670429 A JPS5670429 A JP S5670429A
- Authority
- JP
- Japan
- Prior art keywords
- pin hole
- laser beam
- recorder
- turned
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
PURPOSE:To enable simple and direct measurement of the shape of the laser beam by transferring a pin hole at a right angle to the laser beam and receiving the output of the passed laser beam by a photodetector. CONSTITUTION:The incident beam 1 is limited to a part of the cross section of the beam by the pin hole fitted to a movable mechanism plate 8 and enters the photodetector 3, while the output thereof is given to an amplifier 5 as the voltage of load resistance 4 between both ends and further is inputted in the Y axis of an X-Y recorder 6. When a transverse transfer dial 10 is turned for moving the plate 8, the sliding part (c) of a transfer amount detecting resistance 11 is turned and thereby the voltage between (a) and (c). This voltage between (a) and (c) is given to the X axis of the recorder 6. When the dial 10 is turned, a gear 9 is rotated and the plate 8 moves perpendicularly to the beam 1, moving the pin hole 2 as well. Next, by moving a dial gage 7, the transfer amount is measured. By calibration of the transfer amount of the pin hole 2 and the amount of deflection of the X axis of the recorder, the distribution of strength of the beam is obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14740979A JPS5670429A (en) | 1979-11-14 | 1979-11-14 | Measuring device for laser beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14740979A JPS5670429A (en) | 1979-11-14 | 1979-11-14 | Measuring device for laser beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5670429A true JPS5670429A (en) | 1981-06-12 |
Family
ID=15429638
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14740979A Pending JPS5670429A (en) | 1979-11-14 | 1979-11-14 | Measuring device for laser beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5670429A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989011085A1 (en) * | 1988-04-18 | 1989-11-16 | 3D Systems, Inc. | Stereolithographic beam profiling |
US5495328A (en) * | 1988-04-18 | 1996-02-27 | 3D Systems, Inc. | Apparatus and method for calibrating and normalizing a stereolithographic apparatus |
US5587786A (en) * | 1995-02-23 | 1996-12-24 | Universite Laval | Apparatus for measuring a beam width D.sub.σx along a transverse direction of a laser beam and method thereof |
EP0860267A2 (en) * | 1988-04-18 | 1998-08-26 | 3D Systems, Inc. | Stereolithographic beam profiling |
-
1979
- 1979-11-14 JP JP14740979A patent/JPS5670429A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989011085A1 (en) * | 1988-04-18 | 1989-11-16 | 3D Systems, Inc. | Stereolithographic beam profiling |
US5495328A (en) * | 1988-04-18 | 1996-02-27 | 3D Systems, Inc. | Apparatus and method for calibrating and normalizing a stereolithographic apparatus |
EP0860267A2 (en) * | 1988-04-18 | 1998-08-26 | 3D Systems, Inc. | Stereolithographic beam profiling |
EP0860267A3 (en) * | 1988-04-18 | 1999-01-20 | 3D Systems, Inc. | Stereolithographic beam profiling |
US5587786A (en) * | 1995-02-23 | 1996-12-24 | Universite Laval | Apparatus for measuring a beam width D.sub.σx along a transverse direction of a laser beam and method thereof |
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