JPS5662508U - - Google Patents
Info
- Publication number
- JPS5662508U JPS5662508U JP14600979U JP14600979U JPS5662508U JP S5662508 U JPS5662508 U JP S5662508U JP 14600979 U JP14600979 U JP 14600979U JP 14600979 U JP14600979 U JP 14600979U JP S5662508 U JPS5662508 U JP S5662508U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14600979U JPS5662508U (de) | 1979-10-22 | 1979-10-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14600979U JPS5662508U (de) | 1979-10-22 | 1979-10-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5662508U true JPS5662508U (de) | 1981-05-27 |
Family
ID=29377179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14600979U Pending JPS5662508U (de) | 1979-10-22 | 1979-10-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5662508U (de) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5917104A (ja) * | 1982-07-21 | 1984-01-28 | Matsushita Electric Works Ltd | 形状検査装置 |
JPS608706A (ja) * | 1983-06-29 | 1985-01-17 | Fujitsu Ltd | ボンディングワイヤ形状検査装置 |
JPS6166908A (ja) * | 1984-09-11 | 1986-04-05 | Ikegami Tsushinki Co Ltd | Icリ−ド検出方法 |
JPS61193007A (ja) * | 1985-02-22 | 1986-08-27 | Hitachi Ltd | 棒状突起物体の検査方法 |
JPS61233304A (ja) * | 1985-04-09 | 1986-10-17 | Matsushita Electric Ind Co Ltd | 電子部品リ−ド検査方法 |
JPS6296805A (ja) * | 1985-10-23 | 1987-05-06 | Toyo Kogyo Kk | 電子部品のピン変形検出装置 |
JPS6361105A (ja) * | 1986-08-30 | 1988-03-17 | Maki Seisakusho:Kk | 球塊状物品の外観検査方法と装置 |
JPH01129110A (ja) * | 1987-11-16 | 1989-05-22 | Fujitsu Ltd | リード曲り検査装置 |
JPH0743779U (ja) * | 1994-12-21 | 1995-09-12 | 株式会社マキ製作所 | 物体の外観検査装置 |
JP2006064975A (ja) * | 2004-08-26 | 2006-03-09 | Olympus Corp | 顕微鏡および薄板エッジ検査装置 |
-
1979
- 1979-10-22 JP JP14600979U patent/JPS5662508U/ja active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5917104A (ja) * | 1982-07-21 | 1984-01-28 | Matsushita Electric Works Ltd | 形状検査装置 |
JPS608706A (ja) * | 1983-06-29 | 1985-01-17 | Fujitsu Ltd | ボンディングワイヤ形状検査装置 |
JPS6166908A (ja) * | 1984-09-11 | 1986-04-05 | Ikegami Tsushinki Co Ltd | Icリ−ド検出方法 |
JPS61193007A (ja) * | 1985-02-22 | 1986-08-27 | Hitachi Ltd | 棒状突起物体の検査方法 |
JPS61233304A (ja) * | 1985-04-09 | 1986-10-17 | Matsushita Electric Ind Co Ltd | 電子部品リ−ド検査方法 |
JPS6296805A (ja) * | 1985-10-23 | 1987-05-06 | Toyo Kogyo Kk | 電子部品のピン変形検出装置 |
JPS6361105A (ja) * | 1986-08-30 | 1988-03-17 | Maki Seisakusho:Kk | 球塊状物品の外観検査方法と装置 |
JPH01129110A (ja) * | 1987-11-16 | 1989-05-22 | Fujitsu Ltd | リード曲り検査装置 |
JPH0743779U (ja) * | 1994-12-21 | 1995-09-12 | 株式会社マキ製作所 | 物体の外観検査装置 |
JP2006064975A (ja) * | 2004-08-26 | 2006-03-09 | Olympus Corp | 顕微鏡および薄板エッジ検査装置 |