JPS5662508U - - Google Patents

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Publication number
JPS5662508U
JPS5662508U JP14600979U JP14600979U JPS5662508U JP S5662508 U JPS5662508 U JP S5662508U JP 14600979 U JP14600979 U JP 14600979U JP 14600979 U JP14600979 U JP 14600979U JP S5662508 U JPS5662508 U JP S5662508U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14600979U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14600979U priority Critical patent/JPS5662508U/ja
Publication of JPS5662508U publication Critical patent/JPS5662508U/ja
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
JP14600979U 1979-10-22 1979-10-22 Pending JPS5662508U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14600979U JPS5662508U (de) 1979-10-22 1979-10-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14600979U JPS5662508U (de) 1979-10-22 1979-10-22

Publications (1)

Publication Number Publication Date
JPS5662508U true JPS5662508U (de) 1981-05-27

Family

ID=29377179

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14600979U Pending JPS5662508U (de) 1979-10-22 1979-10-22

Country Status (1)

Country Link
JP (1) JPS5662508U (de)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917104A (ja) * 1982-07-21 1984-01-28 Matsushita Electric Works Ltd 形状検査装置
JPS608706A (ja) * 1983-06-29 1985-01-17 Fujitsu Ltd ボンディングワイヤ形状検査装置
JPS6166908A (ja) * 1984-09-11 1986-04-05 Ikegami Tsushinki Co Ltd Icリ−ド検出方法
JPS61193007A (ja) * 1985-02-22 1986-08-27 Hitachi Ltd 棒状突起物体の検査方法
JPS61233304A (ja) * 1985-04-09 1986-10-17 Matsushita Electric Ind Co Ltd 電子部品リ−ド検査方法
JPS6296805A (ja) * 1985-10-23 1987-05-06 Toyo Kogyo Kk 電子部品のピン変形検出装置
JPS6361105A (ja) * 1986-08-30 1988-03-17 Maki Seisakusho:Kk 球塊状物品の外観検査方法と装置
JPH01129110A (ja) * 1987-11-16 1989-05-22 Fujitsu Ltd リード曲り検査装置
JPH0743779U (ja) * 1994-12-21 1995-09-12 株式会社マキ製作所 物体の外観検査装置
JP2006064975A (ja) * 2004-08-26 2006-03-09 Olympus Corp 顕微鏡および薄板エッジ検査装置

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917104A (ja) * 1982-07-21 1984-01-28 Matsushita Electric Works Ltd 形状検査装置
JPS608706A (ja) * 1983-06-29 1985-01-17 Fujitsu Ltd ボンディングワイヤ形状検査装置
JPS6166908A (ja) * 1984-09-11 1986-04-05 Ikegami Tsushinki Co Ltd Icリ−ド検出方法
JPS61193007A (ja) * 1985-02-22 1986-08-27 Hitachi Ltd 棒状突起物体の検査方法
JPS61233304A (ja) * 1985-04-09 1986-10-17 Matsushita Electric Ind Co Ltd 電子部品リ−ド検査方法
JPS6296805A (ja) * 1985-10-23 1987-05-06 Toyo Kogyo Kk 電子部品のピン変形検出装置
JPS6361105A (ja) * 1986-08-30 1988-03-17 Maki Seisakusho:Kk 球塊状物品の外観検査方法と装置
JPH01129110A (ja) * 1987-11-16 1989-05-22 Fujitsu Ltd リード曲り検査装置
JPH0743779U (ja) * 1994-12-21 1995-09-12 株式会社マキ製作所 物体の外観検査装置
JP2006064975A (ja) * 2004-08-26 2006-03-09 Olympus Corp 顕微鏡および薄板エッジ検査装置

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