JPS5662326A - Heat-treatment process - Google Patents
Heat-treatment processInfo
- Publication number
- JPS5662326A JPS5662326A JP13765279A JP13765279A JPS5662326A JP S5662326 A JPS5662326 A JP S5662326A JP 13765279 A JP13765279 A JP 13765279A JP 13765279 A JP13765279 A JP 13765279A JP S5662326 A JPS5662326 A JP S5662326A
- Authority
- JP
- Japan
- Prior art keywords
- work
- jig
- heat
- wafer
- treatment process
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 title 1
- 238000002485 combustion reaction Methods 0.000 abstract 3
- 239000000919 ceramic Substances 0.000 abstract 1
- 239000006185 dispersion Substances 0.000 abstract 1
- 239000011491 glass wool Substances 0.000 abstract 1
- 230000003647 oxidation Effects 0.000 abstract 1
- 238000007254 oxidation reaction Methods 0.000 abstract 1
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
PURPOSE:To eliminate oxidation and unstable dispersion, when heating a work at a prescribed temperature and making it react by jetting gas from one side of a furnace, by providing a buffer between the work and gas combustion flame. CONSTITUTION:A H2 combustion flame alleviating jig 7 is provided between an H2 combustion unit 6 and a wafer jig 1. The jig 7 is formed by quarts or opaque quartz, etc. enclosing Si, SiC, ceramic and glass wool, etc. which are similar in shape to the wafer 2 which is a work to be heat-treated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13765279A JPS5662326A (en) | 1979-10-26 | 1979-10-26 | Heat-treatment process |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13765279A JPS5662326A (en) | 1979-10-26 | 1979-10-26 | Heat-treatment process |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5662326A true JPS5662326A (en) | 1981-05-28 |
Family
ID=15203640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13765279A Pending JPS5662326A (en) | 1979-10-26 | 1979-10-26 | Heat-treatment process |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5662326A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58116737A (en) * | 1981-12-30 | 1983-07-12 | Oki Electric Ind Co Ltd | Semiconductor wafer thermal processing apparatus |
US5445522A (en) * | 1993-04-26 | 1995-08-29 | Tokyo Electron Kabushiki Kaisha | Combustion device |
KR100604661B1 (en) | 2004-07-27 | 2006-07-25 | 주식회사 하이닉스반도체 | Develop rinse nozzle provided with alleviation wall |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5329670A (en) * | 1976-08-31 | 1978-03-20 | Nec Corp | Thermal oxidation method of semiconductors |
-
1979
- 1979-10-26 JP JP13765279A patent/JPS5662326A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5329670A (en) * | 1976-08-31 | 1978-03-20 | Nec Corp | Thermal oxidation method of semiconductors |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58116737A (en) * | 1981-12-30 | 1983-07-12 | Oki Electric Ind Co Ltd | Semiconductor wafer thermal processing apparatus |
US5445522A (en) * | 1993-04-26 | 1995-08-29 | Tokyo Electron Kabushiki Kaisha | Combustion device |
KR100604661B1 (en) | 2004-07-27 | 2006-07-25 | 주식회사 하이닉스반도체 | Develop rinse nozzle provided with alleviation wall |
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