JPS5657977A - X-ray quality measuring apparatus - Google Patents

X-ray quality measuring apparatus

Info

Publication number
JPS5657977A
JPS5657977A JP13246979A JP13246979A JPS5657977A JP S5657977 A JPS5657977 A JP S5657977A JP 13246979 A JP13246979 A JP 13246979A JP 13246979 A JP13246979 A JP 13246979A JP S5657977 A JPS5657977 A JP S5657977A
Authority
JP
Japan
Prior art keywords
ray
filters
4aw4c
dosimeters
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13246979A
Other languages
Japanese (ja)
Inventor
Koji Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ARUKO DENKI KK
Original Assignee
ARUKO DENKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ARUKO DENKI KK filed Critical ARUKO DENKI KK
Priority to JP13246979A priority Critical patent/JPS5657977A/en
Publication of JPS5657977A publication Critical patent/JPS5657977A/en
Pending legal-status Critical Current

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  • Measurement Of Radiation (AREA)

Abstract

PURPOSE: To make possible the measurement through short-time irradiation by disposing a plurality of X-ray collimators, X-ray filters and X-ray dosimeters and providing means of calculating the half-value layer and effective energy of X-rays from the outputs of the dosimeters and the thicknesses of the filters.
CONSTITUTION: X-rays are entered into X-ray filters 2aW2c (2a is usually made blank) through the X-ray collimators 1aW1c disposed on the X-ray incident axis and the X-ray doses having transmitted therethrough are converted to the quantity of electricity by, for example, ionization chambers 3aW3c. These are then integrated in integrators 4aW4c. The output signals thereof are inputted to a computer 9 for arithmetic operations by way of amplifiers 4aW4c, an analog switch 6, an AD converter 7, and computer 8 for controlling, and the half-value layer (HVL) values, effective energy values, etc. having been calculated according to the predetermined formulas are displayed in a display unit 10.
COPYRIGHT: (C)1981,JPO&Japio
JP13246979A 1979-10-16 1979-10-16 X-ray quality measuring apparatus Pending JPS5657977A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13246979A JPS5657977A (en) 1979-10-16 1979-10-16 X-ray quality measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13246979A JPS5657977A (en) 1979-10-16 1979-10-16 X-ray quality measuring apparatus

Publications (1)

Publication Number Publication Date
JPS5657977A true JPS5657977A (en) 1981-05-20

Family

ID=15082096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13246979A Pending JPS5657977A (en) 1979-10-16 1979-10-16 X-ray quality measuring apparatus

Country Status (1)

Country Link
JP (1) JPS5657977A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104207794A (en) * 2014-09-25 2014-12-17 中测测试科技有限公司 Mammography multi-parameter sensor array and measuring method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104207794A (en) * 2014-09-25 2014-12-17 中测测试科技有限公司 Mammography multi-parameter sensor array and measuring method thereof

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