JPS5657977A - X-ray quality measuring apparatus - Google Patents
X-ray quality measuring apparatusInfo
- Publication number
- JPS5657977A JPS5657977A JP13246979A JP13246979A JPS5657977A JP S5657977 A JPS5657977 A JP S5657977A JP 13246979 A JP13246979 A JP 13246979A JP 13246979 A JP13246979 A JP 13246979A JP S5657977 A JPS5657977 A JP S5657977A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- filters
- 4aw4c
- dosimeters
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Radiation (AREA)
Abstract
PURPOSE: To make possible the measurement through short-time irradiation by disposing a plurality of X-ray collimators, X-ray filters and X-ray dosimeters and providing means of calculating the half-value layer and effective energy of X-rays from the outputs of the dosimeters and the thicknesses of the filters.
CONSTITUTION: X-rays are entered into X-ray filters 2aW2c (2a is usually made blank) through the X-ray collimators 1aW1c disposed on the X-ray incident axis and the X-ray doses having transmitted therethrough are converted to the quantity of electricity by, for example, ionization chambers 3aW3c. These are then integrated in integrators 4aW4c. The output signals thereof are inputted to a computer 9 for arithmetic operations by way of amplifiers 4aW4c, an analog switch 6, an AD converter 7, and computer 8 for controlling, and the half-value layer (HVL) values, effective energy values, etc. having been calculated according to the predetermined formulas are displayed in a display unit 10.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13246979A JPS5657977A (en) | 1979-10-16 | 1979-10-16 | X-ray quality measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13246979A JPS5657977A (en) | 1979-10-16 | 1979-10-16 | X-ray quality measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5657977A true JPS5657977A (en) | 1981-05-20 |
Family
ID=15082096
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13246979A Pending JPS5657977A (en) | 1979-10-16 | 1979-10-16 | X-ray quality measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5657977A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104207794A (en) * | 2014-09-25 | 2014-12-17 | 中测测试科技有限公司 | Mammography multi-parameter sensor array and measuring method thereof |
-
1979
- 1979-10-16 JP JP13246979A patent/JPS5657977A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104207794A (en) * | 2014-09-25 | 2014-12-17 | 中测测试科技有限公司 | Mammography multi-parameter sensor array and measuring method thereof |
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