JPS5729976A - Semiconductor dosage meter - Google Patents

Semiconductor dosage meter

Info

Publication number
JPS5729976A
JPS5729976A JP10570780A JP10570780A JPS5729976A JP S5729976 A JPS5729976 A JP S5729976A JP 10570780 A JP10570780 A JP 10570780A JP 10570780 A JP10570780 A JP 10570780A JP S5729976 A JPS5729976 A JP S5729976A
Authority
JP
Japan
Prior art keywords
semiconductor
ratio
energy
radiant ray
sensitivity ratio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10570780A
Other languages
Japanese (ja)
Inventor
Yasuo Iwaki
Chiaki Yamamoto
Hisatomi Taguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP10570780A priority Critical patent/JPS5729976A/en
Publication of JPS5729976A publication Critical patent/JPS5729976A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02Dosimeters
    • G01T1/026Semiconductor dose-rate meters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To obtain an exact measured value, by deriving the energy of an irradiation radiant ray, obtaining a sensitivity ratio by this energy, and compensating an output of a semiconductor radiant ray detector by this sensitivity ratio. CONSTITUTION:This meter is provided with semiconductor radiant ray detectors 21-23 on which a filter 41 has been provided, and semiconductor radiant ray detectors 11-13 on which no filter is provided. A ratio of outputs of both these detectors is calculated by a ratio calculating circuit, and an energy calculating circuit 52 for calculating the energy of an irradiation radiant ray from said ratio, and a sensitivity ratio calculating circuit 53 for deriving the sensitivity ratio from said energy are provided on this meter, so that outputs of the semiconductor radiant ray detectors 11-13 and 21-23 are compensated by the sensitivity ratio which has been derived.
JP10570780A 1980-07-31 1980-07-31 Semiconductor dosage meter Pending JPS5729976A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10570780A JPS5729976A (en) 1980-07-31 1980-07-31 Semiconductor dosage meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10570780A JPS5729976A (en) 1980-07-31 1980-07-31 Semiconductor dosage meter

Publications (1)

Publication Number Publication Date
JPS5729976A true JPS5729976A (en) 1982-02-18

Family

ID=14414813

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10570780A Pending JPS5729976A (en) 1980-07-31 1980-07-31 Semiconductor dosage meter

Country Status (1)

Country Link
JP (1) JPS5729976A (en)

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