JPS5648550A - Measuring method of frictional charging - Google Patents
Measuring method of frictional chargingInfo
- Publication number
- JPS5648550A JPS5648550A JP12618979A JP12618979A JPS5648550A JP S5648550 A JPS5648550 A JP S5648550A JP 12618979 A JP12618979 A JP 12618979A JP 12618979 A JP12618979 A JP 12618979A JP S5648550 A JPS5648550 A JP S5648550A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- measurement
- frictional
- plate
- supporter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 abstract 4
- 239000000126 substance Substances 0.000 abstract 2
- 230000005611 electricity Effects 0.000 abstract 1
- 230000003252 repetitive effect Effects 0.000 abstract 1
- 230000003068 static effect Effects 0.000 abstract 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12618979A JPS5648550A (en) | 1979-09-28 | 1979-09-28 | Measuring method of frictional charging |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12618979A JPS5648550A (en) | 1979-09-28 | 1979-09-28 | Measuring method of frictional charging |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5648550A true JPS5648550A (en) | 1981-05-01 |
JPS6211303B2 JPS6211303B2 (enrdf_load_stackoverflow) | 1987-03-11 |
Family
ID=14928890
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12618979A Granted JPS5648550A (en) | 1979-09-28 | 1979-09-28 | Measuring method of frictional charging |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5648550A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4954772A (en) * | 1987-11-12 | 1990-09-04 | Mitsubishi Denki Kabushiki Kaisha | Test method of an electrostatic breakdown of a semiconductor device and an apparatus therefor |
US5211702A (en) * | 1989-11-29 | 1993-05-18 | Kao Corporation | Goods handling method and apparatus thereof |
JP2006194731A (ja) * | 2005-01-13 | 2006-07-27 | Tdk Corp | 帯電位測定装置および帯電位測定方法 |
CN100335907C (zh) * | 2005-03-23 | 2007-09-05 | 华南理工大学 | 一种静电动态电位的多因素联合效应模拟试验装置 |
-
1979
- 1979-09-28 JP JP12618979A patent/JPS5648550A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4954772A (en) * | 1987-11-12 | 1990-09-04 | Mitsubishi Denki Kabushiki Kaisha | Test method of an electrostatic breakdown of a semiconductor device and an apparatus therefor |
US5211702A (en) * | 1989-11-29 | 1993-05-18 | Kao Corporation | Goods handling method and apparatus thereof |
US5320480A (en) * | 1989-11-29 | 1994-06-14 | Kao Corporation | Goods handling method and apparatus thereof |
JP2006194731A (ja) * | 2005-01-13 | 2006-07-27 | Tdk Corp | 帯電位測定装置および帯電位測定方法 |
CN100335907C (zh) * | 2005-03-23 | 2007-09-05 | 华南理工大学 | 一种静电动态电位的多因素联合效应模拟试验装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS6211303B2 (enrdf_load_stackoverflow) | 1987-03-11 |
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