JPS564295A - Probe device for measuring conductivity of plated through hole - Google Patents

Probe device for measuring conductivity of plated through hole

Info

Publication number
JPS564295A
JPS564295A JP7914180A JP7914180A JPS564295A JP S564295 A JPS564295 A JP S564295A JP 7914180 A JP7914180 A JP 7914180A JP 7914180 A JP7914180 A JP 7914180A JP S564295 A JPS564295 A JP S564295A
Authority
JP
Japan
Prior art keywords
plated
hole
probe device
measuring conductivity
conductivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7914180A
Other languages
English (en)
Inventor
Oo Waaru Robaato
Riiba Deritsuku
Maatein Retsusaa Jiei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UPA Tech Inc
Original Assignee
UPA Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UPA Tech Inc filed Critical UPA Tech Inc
Publication of JPS564295A publication Critical patent/JPS564295A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP7914180A 1979-06-14 1980-06-13 Probe device for measuring conductivity of plated through hole Pending JPS564295A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/048,547 US4245189A (en) 1979-06-14 1979-06-14 Probe assembly for measuring conductivity of plated through holes

Publications (1)

Publication Number Publication Date
JPS564295A true JPS564295A (en) 1981-01-17

Family

ID=21955171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7914180A Pending JPS564295A (en) 1979-06-14 1980-06-13 Probe device for measuring conductivity of plated through hole

Country Status (4)

Country Link
US (1) US4245189A (ja)
EP (1) EP0021697B1 (ja)
JP (1) JPS564295A (ja)
DE (1) DE3066152D1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59222996A (ja) * 1983-06-01 1984-12-14 株式会社中央製作所 表面処理装置におけるハンガ−の保持装置

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4423373A (en) * 1981-03-16 1983-12-27 Lecroy Research Systems Corporation Test probe
DE3316103C2 (de) * 1983-05-03 1991-12-12 Nixdorf Computer Ag, 4790 Paderborn Prüfnadel für ein Prüfgerät zum Prüfen von Leiterplatten
US4675600A (en) * 1984-05-17 1987-06-23 Geo International Corporation Testing apparatus for plated through-holes on printed circuit boards, and probe therefor
GB8829273D0 (en) * 1988-12-15 1989-01-25 Bath Scient Ltd Electrical testing probe
US5366380A (en) * 1989-06-13 1994-11-22 General Datacomm, Inc. Spring biased tapered contact elements for electrical connectors and integrated circuit packages
US5425649A (en) * 1989-06-13 1995-06-20 General Datacomm, Inc. Connector system having switching and testing functions using tapered spring contact elements and actuators therefor
US5256073A (en) * 1989-06-13 1993-10-26 General Datacomm, Inc. Electrical connectors for direct connection to plated through holes in circuit board
US5215471A (en) * 1989-06-13 1993-06-01 General Datacomm, Inc. Electrical connectors having tapered spring contact elements for direct mating to holes
US4966556A (en) * 1989-06-13 1990-10-30 General Datacomm, Inc. Electrical connector for direct connection to plated through holes in circuit board
US5032787A (en) * 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
JP2759299B2 (ja) * 1990-04-16 1998-05-28 日本シイエムケイ株式会社 スルーホールを有するプリント配線板
DE4212881A1 (de) * 1992-04-17 1993-10-21 Diehl Gmbh & Co Einrichtung zur Bestimmung des Beschichtungszustandes eines Gegenstandes in einem galvanischen Bad und Verfahren zur Herstellung solcher Einrichtungen
WO1999035715A1 (en) * 1998-01-05 1999-07-15 Rika Electronics International, Inc. Coaxial contact assembly apparatus
US6262579B1 (en) 1998-11-13 2001-07-17 Kulicke & Soffa Holdings, Inc. Method and structure for detecting open vias in high density interconnect substrates
WO2000031828A2 (en) 1998-11-25 2000-06-02 Rika Electronics International, Inc. Electrical contact system
US7102370B2 (en) * 2004-04-22 2006-09-05 Agilent Technologies, Inc. Compliant micro-browser for a hand held probe
JP2007218840A (ja) * 2006-02-20 2007-08-30 Fujitsu Ltd プローブ、プローブカード及び検査装置
US7456642B2 (en) * 2006-09-25 2008-11-25 Ceramic Component Technologies, Inc. Handheld electronic test probe assembly
US9529014B1 (en) * 2013-03-15 2016-12-27 Insight Photonic Solutions, Inc. System and method for acquiring electrical measurements of an electronic device
CN103323635B (zh) * 2013-06-21 2015-12-02 深圳市华星光电技术有限公司 用于检测接触效果的探针模组
US9267969B2 (en) * 2013-11-13 2016-02-23 Hamilton Sundstrand Corporation Electrical connector pin cover
US10705119B2 (en) * 2018-02-21 2020-07-07 Fluke Corporation Shrouded test probe

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4914690U (ja) * 1972-05-08 1974-02-07
JPS50100572A (ja) * 1974-01-07 1975-08-09

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD92086A (ja) *
US902753A (en) * 1907-05-08 1908-11-03 George E Marshall Bullet-probe.
US2208023A (en) * 1937-08-21 1940-07-16 Francis C Ellis Electrode
US3229200A (en) * 1961-11-17 1966-01-11 Illinois Tool Works Resistor test probe
GB1244572A (en) * 1969-05-23 1971-09-02 M E L Equipment Co Ltd Electrical probe
DE2204169A1 (de) * 1972-01-29 1973-08-02 Siemens Ag Tastkopf fuer pruefzwecke
US3885215A (en) * 1974-01-07 1975-05-20 Unit Process Assemblies Electrode assembly for measuring the effective thickness of thru-hole plating in circuit board workpieces or the like
US4042880A (en) * 1974-01-07 1977-08-16 Unit Process Assemblies, Inc. Electrode assembly for measuring the effective thickness of thru-hole plating circuit board workpieces
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4914690U (ja) * 1972-05-08 1974-02-07
JPS50100572A (ja) * 1974-01-07 1975-08-09

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59222996A (ja) * 1983-06-01 1984-12-14 株式会社中央製作所 表面処理装置におけるハンガ−の保持装置

Also Published As

Publication number Publication date
US4245189A (en) 1981-01-13
EP0021697A3 (en) 1981-07-15
DE3066152D1 (en) 1984-02-23
EP0021697B1 (en) 1984-01-18
EP0021697A2 (en) 1981-01-07

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