JPS5642355A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5642355A JPS5642355A JP11707279A JP11707279A JPS5642355A JP S5642355 A JPS5642355 A JP S5642355A JP 11707279 A JP11707279 A JP 11707279A JP 11707279 A JP11707279 A JP 11707279A JP S5642355 A JPS5642355 A JP S5642355A
- Authority
- JP
- Japan
- Prior art keywords
- polysilicon
- si3n4
- film
- mask
- polysilicons
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To contrive the improvement in the integrity of the semiconductor device by forming a polysilicon film on an Si substrate, etching it in electrode and wire pattern with Si3N4 mask, forming an SiO2 film on the exposed surface of the substrate and the polysilicon, then etching Si3N4 mask and forming a conductive layer on the polysilicon. CONSTITUTION:An N type polysilicon 24 is superimposed on the field oxide film and the gate oxide film 23 on a P type Si substrate, Si3N4 masks 261, 262 are covered thereon, the polysilicon 24 is etched, and polysilicons 241, 242 are retained together with the film 23. Then, the mask 262 is selectively opened, and Si3N4 masks 281, 282 are formed thereon. Subsequently, an N<+> type diffused layer is formed thereon, is thermally oxidized, and SiO2 film 29 is covered thereon. Eventually, the masks 281, 282 are etched, and a wiring layer 31 is formed thereon. Since the connecting holes 301, 302 are self-matched in the same width as those of the polysilicons 241, 242 according to this configuration, it is not necessary to provide the mask margin. Further, the polysilicons 241, 31 are self-matched in connection on the gate. Accordingly, it can remarkably improve the integrity of the semiconductor device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11707279A JPS5642355A (en) | 1979-09-12 | 1979-09-12 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11707279A JPS5642355A (en) | 1979-09-12 | 1979-09-12 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5642355A true JPS5642355A (en) | 1981-04-20 |
Family
ID=14702709
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11707279A Pending JPS5642355A (en) | 1979-09-12 | 1979-09-12 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5642355A (en) |
-
1979
- 1979-09-12 JP JP11707279A patent/JPS5642355A/en active Pending
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