JPS5640738A - Mft inspection device - Google Patents
Mft inspection deviceInfo
- Publication number
- JPS5640738A JPS5640738A JP11583579A JP11583579A JPS5640738A JP S5640738 A JPS5640738 A JP S5640738A JP 11583579 A JP11583579 A JP 11583579A JP 11583579 A JP11583579 A JP 11583579A JP S5640738 A JPS5640738 A JP S5640738A
- Authority
- JP
- Japan
- Prior art keywords
- image
- solid scanning
- scanning element
- test chart
- solid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
PURPOSE:To exclude mechanical scanning part and to quicken the inspection speed, by using the solid scanning element as the photodetector of the device measuring the transfer function of the optical element. CONSTITUTION:On the substrate 16 in which the center is in agreement with the light axis and the rotation is possible, the solid scanning element 171 is located for the signal detection of the test chart image and the solid scanning elements 172- 175 which are twice the number of image heights, are located for the signal detection of the test chart image of each image height. Each solid scanning element detects the signals of the test chart image of tangential or radial direction of each image height on the same radiation (a), (b) or of the same image height. Further, by rotating the substrate 16, the measurement is made at an arbitrary position. The detection signal from the solid scanning element is processed electrically to measure the trasfer function (MTF) of the optical elements.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11583579A JPS5640738A (en) | 1979-09-10 | 1979-09-10 | Mft inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11583579A JPS5640738A (en) | 1979-09-10 | 1979-09-10 | Mft inspection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5640738A true JPS5640738A (en) | 1981-04-17 |
JPS6411887B2 JPS6411887B2 (en) | 1989-02-27 |
Family
ID=14672290
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11583579A Granted JPS5640738A (en) | 1979-09-10 | 1979-09-10 | Mft inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5640738A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58186454U (en) * | 1982-06-07 | 1983-12-10 | 株式会社リコー | MTF measuring device |
CN105675266A (en) * | 2016-02-03 | 2016-06-15 | 上海仪万光电科技有限公司 | Device and method for measuring modulation transfer function of optical lens based on infinite conjugate optical path |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54107758A (en) * | 1978-02-10 | 1979-08-23 | Asahi Optical Co Ltd | Lens efficiency determining system |
-
1979
- 1979-09-10 JP JP11583579A patent/JPS5640738A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54107758A (en) * | 1978-02-10 | 1979-08-23 | Asahi Optical Co Ltd | Lens efficiency determining system |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58186454U (en) * | 1982-06-07 | 1983-12-10 | 株式会社リコー | MTF measuring device |
CN105675266A (en) * | 2016-02-03 | 2016-06-15 | 上海仪万光电科技有限公司 | Device and method for measuring modulation transfer function of optical lens based on infinite conjugate optical path |
CN105675266B (en) * | 2016-02-03 | 2018-06-26 | 上海仪万光电科技有限公司 | Infinite conjugate optical path measures the device and method of the modulation transfer function of optical lens |
Also Published As
Publication number | Publication date |
---|---|
JPS6411887B2 (en) | 1989-02-27 |
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