JPS562300B2 - - Google Patents

Info

Publication number
JPS562300B2
JPS562300B2 JP8155272A JP8155272A JPS562300B2 JP S562300 B2 JPS562300 B2 JP S562300B2 JP 8155272 A JP8155272 A JP 8155272A JP 8155272 A JP8155272 A JP 8155272A JP S562300 B2 JPS562300 B2 JP S562300B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8155272A
Other versions
JPS4829482A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4829482A publication Critical patent/JPS4829482A/ja
Publication of JPS562300B2 publication Critical patent/JPS562300B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP8155272A 1971-08-16 1972-08-16 Expired JPS562300B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17189471A 1971-08-16 1971-08-16

Publications (2)

Publication Number Publication Date
JPS4829482A JPS4829482A (ja) 1973-04-19
JPS562300B2 true JPS562300B2 (ja) 1981-01-19

Family

ID=22625542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8155272A Expired JPS562300B2 (ja) 1971-08-16 1972-08-16

Country Status (8)

Country Link
US (1) US3746784A (ja)
JP (1) JPS562300B2 (ja)
AU (1) AU466845B2 (ja)
BE (1) BE787593A (ja)
CA (1) CA994447A (ja)
FR (1) FR2150114A5 (ja)
GB (2) GB1401289A (ja)
IT (1) IT961965B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5837199U (ja) * 1981-09-03 1983-03-10 松下電器産業株式会社 チツプ状電子部品のテ−ピング状集合体
JPH0364258U (ja) * 1989-10-20 1991-06-24

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934385A (ja) * 1972-07-28 1974-03-29
US3886356A (en) * 1973-09-10 1975-05-27 Inex Inc Optical inspection apparatus
US3919531A (en) * 1974-05-16 1975-11-11 Libbey Owens Ford Co Method of and apparatus for inspecting the contours of moving bent articles
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
JPS5829456B2 (ja) * 1974-10-29 1983-06-22 三洋電機株式会社 イドウブツタイカンソクソウチ
US4002823A (en) * 1974-11-01 1977-01-11 Ball Corporation Method and apparatus for video inspection of articles of manufacture
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
JPS5312377A (en) * 1976-07-20 1978-02-03 Nippon Steel Corp Inspecting apparatus for surface
US4139306A (en) * 1977-02-07 1979-02-13 General Electric Company Television inspection system
JPS5434886A (en) * 1977-08-24 1979-03-14 Kanebo Ltd Inspector
GB1600400A (en) * 1977-10-13 1981-10-14 Ti Fords Ltd Bottle inspection apparatus
JPS5472094A (en) * 1977-11-21 1979-06-09 Sapporo Breweries Ltd Bottle bottom inspecting machine
JPS54139784A (en) * 1978-04-21 1979-10-30 Ngk Insulators Ltd Method and device for testing ceramic piece having innumerable through pores
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS5571937A (en) * 1978-11-24 1980-05-30 Kanebo Ltd Method of and device for inspecting surface
US4394683A (en) * 1980-06-26 1983-07-19 Diffracto Ltd. New photodetector array based optical measurement systems
DE3028942A1 (de) 1980-07-30 1982-02-18 Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche
US4612614A (en) * 1980-09-12 1986-09-16 International Remote Imaging Systems, Inc. Method of analyzing particles in a fluid sample
US4393466A (en) * 1980-09-12 1983-07-12 International Remote Imaging Systems Method of analyzing particles in a dilute fluid sample
JPS58219441A (ja) * 1982-06-15 1983-12-20 Hajime Sangyo Kk 凸面体の表面欠陥検査装置
JPS59173400A (ja) * 1983-03-17 1984-10-01 本州製紙株式会社 金属性物質の包装用材料の製造方法
US4691231A (en) * 1985-10-01 1987-09-01 Vistech Corporation Bottle inspection system
JPS62156399A (ja) * 1985-12-26 1987-07-11 日本紙業株式会社 防錆段ボ−ル原紙
US4750035A (en) * 1986-09-11 1988-06-07 Inex/Vistech Technologies, Inc. Video container inspection with collimated viewing of plural containers
US5072127A (en) * 1987-10-09 1991-12-10 Pressco, Inc. Engineered video inspecting lighting array
US5051825A (en) * 1989-04-07 1991-09-24 Pressco, Inc. Dual image video inspection apparatus
DE4031142C3 (de) * 1990-10-02 1998-01-29 Sick Optik Elektronik Erwin Optischer Lichttaster und Verfahren zu seinem Betrieb
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
GB9408446D0 (en) * 1994-04-28 1994-06-22 Electronic Automation Ltd Apparatus and method for inspecting hot glass containers
KR970017562A (ko) * 1995-09-29 1997-04-30 배순훈 테이프의 끊김 감지장치
US5752436A (en) * 1996-10-24 1998-05-19 Utz Quality Foods, Inc. Potato peeling apparatus
US5662034A (en) * 1996-03-08 1997-09-02 Utz Quality Foods, Inc. Potato peeling system
ES2284410B1 (es) * 2007-04-02 2009-04-01 Acerinox, S.A. Dispositivo para la deteccion y la clasificacion de oxido residual en lineas de produccion de laminados metalicos.

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4218279Y1 (ja) * 1964-12-19 1967-10-23
US3598907A (en) * 1968-05-20 1971-08-10 Emhart Corp Article inspection by successively televised images

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2798605A (en) * 1950-07-12 1957-07-09 Tele Tect Corp Electronic inspection apparatus
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
US3560096A (en) * 1967-12-07 1971-02-02 Morvue Inc Veneer clipper control system
US3579249A (en) * 1969-08-08 1971-05-18 Reynolds Metals Co Feature counter having between limits amplitude and/or width discrimination
US3647961A (en) * 1970-04-09 1972-03-07 Western Electric Co T.v. -aided flaw detection using rotating image techniques

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4218279Y1 (ja) * 1964-12-19 1967-10-23
US3598907A (en) * 1968-05-20 1971-08-10 Emhart Corp Article inspection by successively televised images

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5837199U (ja) * 1981-09-03 1983-03-10 松下電器産業株式会社 チツプ状電子部品のテ−ピング状集合体
JPH0364258U (ja) * 1989-10-20 1991-06-24

Also Published As

Publication number Publication date
IT961965B (it) 1973-12-10
GB1401288A (en) 1975-07-16
FR2150114A5 (ja) 1973-03-30
AU4550972A (en) 1974-02-14
BE787593A (fr) 1972-12-18
GB1401289A (en) 1975-07-16
US3746784A (en) 1973-07-17
CA994447A (en) 1976-08-03
DE2240833A1 (de) 1973-03-22
AU466845B2 (en) 1975-11-13
JPS4829482A (ja) 1973-04-19
DE2240833B2 (de) 1976-10-14

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