CA994447A - Electronic defect detecting apparatus - Google Patents

Electronic defect detecting apparatus

Info

Publication number
CA994447A
CA994447A CA148,437A CA148437A CA994447A CA 994447 A CA994447 A CA 994447A CA 148437 A CA148437 A CA 148437A CA 994447 A CA994447 A CA 994447A
Authority
CA
Canada
Prior art keywords
detecting apparatus
defect detecting
electronic defect
electronic
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA148,437A
Other languages
English (en)
Other versions
CA148437S (en
Inventor
Jack T. Van Oosterhout
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ball Corp
Original Assignee
Ball Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ball Corp filed Critical Ball Corp
Priority to CA239,417A priority Critical patent/CA993055A/en
Application granted granted Critical
Publication of CA994447A publication Critical patent/CA994447A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CA148,437A 1971-08-16 1972-08-01 Electronic defect detecting apparatus Expired CA994447A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA239,417A CA993055A (en) 1971-08-16 1975-11-12 Electronic circuit for use in an assembly for detecting defects in articles of manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17189471A 1971-08-16 1971-08-16

Publications (1)

Publication Number Publication Date
CA994447A true CA994447A (en) 1976-08-03

Family

ID=22625542

Family Applications (1)

Application Number Title Priority Date Filing Date
CA148,437A Expired CA994447A (en) 1971-08-16 1972-08-01 Electronic defect detecting apparatus

Country Status (8)

Country Link
US (1) US3746784A (ja)
JP (1) JPS562300B2 (ja)
AU (1) AU466845B2 (ja)
BE (1) BE787593A (ja)
CA (1) CA994447A (ja)
FR (1) FR2150114A5 (ja)
GB (2) GB1401289A (ja)
IT (1) IT961965B (ja)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934385A (ja) * 1972-07-28 1974-03-29
US3886356A (en) * 1973-09-10 1975-05-27 Inex Inc Optical inspection apparatus
US3919531A (en) * 1974-05-16 1975-11-11 Libbey Owens Ford Co Method of and apparatus for inspecting the contours of moving bent articles
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
JPS5829456B2 (ja) * 1974-10-29 1983-06-22 三洋電機株式会社 イドウブツタイカンソクソウチ
US4002823A (en) * 1974-11-01 1977-01-11 Ball Corporation Method and apparatus for video inspection of articles of manufacture
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
JPS5312377A (en) * 1976-07-20 1978-02-03 Nippon Steel Corp Inspecting apparatus for surface
US4139306A (en) * 1977-02-07 1979-02-13 General Electric Company Television inspection system
JPS5434886A (en) * 1977-08-24 1979-03-14 Kanebo Ltd Inspector
GB1600400A (en) * 1977-10-13 1981-10-14 Ti Fords Ltd Bottle inspection apparatus
JPS5472094A (en) * 1977-11-21 1979-06-09 Sapporo Breweries Ltd Bottle bottom inspecting machine
JPS54139784A (en) * 1978-04-21 1979-10-30 Ngk Insulators Ltd Method and device for testing ceramic piece having innumerable through pores
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS5571937A (en) * 1978-11-24 1980-05-30 Kanebo Ltd Method of and device for inspecting surface
US4394683A (en) * 1980-06-26 1983-07-19 Diffracto Ltd. New photodetector array based optical measurement systems
DE3028942A1 (de) 1980-07-30 1982-02-18 Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche
US4612614A (en) * 1980-09-12 1986-09-16 International Remote Imaging Systems, Inc. Method of analyzing particles in a fluid sample
US4393466A (en) * 1980-09-12 1983-07-12 International Remote Imaging Systems Method of analyzing particles in a dilute fluid sample
JPS5837199U (ja) * 1981-09-03 1983-03-10 松下電器産業株式会社 チツプ状電子部品のテ−ピング状集合体
JPS58219441A (ja) * 1982-06-15 1983-12-20 Hajime Sangyo Kk 凸面体の表面欠陥検査装置
JPS59173400A (ja) * 1983-03-17 1984-10-01 本州製紙株式会社 金属性物質の包装用材料の製造方法
US4691231A (en) * 1985-10-01 1987-09-01 Vistech Corporation Bottle inspection system
JPS62156399A (ja) * 1985-12-26 1987-07-11 日本紙業株式会社 防錆段ボ−ル原紙
US4750035A (en) * 1986-09-11 1988-06-07 Inex/Vistech Technologies, Inc. Video container inspection with collimated viewing of plural containers
US5072127A (en) * 1987-10-09 1991-12-10 Pressco, Inc. Engineered video inspecting lighting array
US5051825A (en) * 1989-04-07 1991-09-24 Pressco, Inc. Dual image video inspection apparatus
JPH0364258U (ja) * 1989-10-20 1991-06-24
DE4031142C3 (de) * 1990-10-02 1998-01-29 Sick Optik Elektronik Erwin Optischer Lichttaster und Verfahren zu seinem Betrieb
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
GB9408446D0 (en) * 1994-04-28 1994-06-22 Electronic Automation Ltd Apparatus and method for inspecting hot glass containers
KR970017562A (ko) * 1995-09-29 1997-04-30 배순훈 테이프의 끊김 감지장치
US5662034A (en) * 1996-03-08 1997-09-02 Utz Quality Foods, Inc. Potato peeling system
US5752436A (en) * 1996-10-24 1998-05-19 Utz Quality Foods, Inc. Potato peeling apparatus
ES2284410B1 (es) * 2007-04-02 2009-04-01 Acerinox, S.A. Dispositivo para la deteccion y la clasificacion de oxido residual en lineas de produccion de laminados metalicos.

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2798605A (en) * 1950-07-12 1957-07-09 Tele Tect Corp Electronic inspection apparatus
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
JPS4218279Y1 (ja) * 1964-12-19 1967-10-23
US3560096A (en) * 1967-12-07 1971-02-02 Morvue Inc Veneer clipper control system
US3598907A (en) * 1968-05-20 1971-08-10 Emhart Corp Article inspection by successively televised images
US3579249A (en) * 1969-08-08 1971-05-18 Reynolds Metals Co Feature counter having between limits amplitude and/or width discrimination
US3647961A (en) * 1970-04-09 1972-03-07 Western Electric Co T.v. -aided flaw detection using rotating image techniques

Also Published As

Publication number Publication date
US3746784A (en) 1973-07-17
AU4550972A (en) 1974-02-14
AU466845B2 (en) 1975-11-13
DE2240833B2 (de) 1976-10-14
GB1401289A (en) 1975-07-16
BE787593A (fr) 1972-12-18
JPS562300B2 (ja) 1981-01-19
GB1401288A (en) 1975-07-16
IT961965B (it) 1973-12-10
JPS4829482A (ja) 1973-04-19
FR2150114A5 (ja) 1973-03-30
DE2240833A1 (de) 1973-03-22

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