JPS5622972A - Method and device of electrical short test etc* - Google Patents

Method and device of electrical short test etc*

Info

Publication number
JPS5622972A
JPS5622972A JP8007680A JP8007680A JPS5622972A JP S5622972 A JPS5622972 A JP S5622972A JP 8007680 A JP8007680 A JP 8007680A JP 8007680 A JP8007680 A JP 8007680A JP S5622972 A JPS5622972 A JP S5622972A
Authority
JP
Japan
Prior art keywords
electrical short
test etc
short test
electrical
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8007680A
Other languages
English (en)
Other versions
JPS6230383B2 (ja
Inventor
Daburiyu Shiiru Deebitsudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Genrad Inc
Original Assignee
Genrad Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genrad Inc filed Critical Genrad Inc
Publication of JPS5622972A publication Critical patent/JPS5622972A/ja
Publication of JPS6230383B2 publication Critical patent/JPS6230383B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
JP8007680A 1979-06-22 1980-06-13 Method and device of electrical short test etc* Granted JPS5622972A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/050,993 US4290013A (en) 1979-06-22 1979-06-22 Method of and apparatus for electrical short testing and the like

Publications (2)

Publication Number Publication Date
JPS5622972A true JPS5622972A (en) 1981-03-04
JPS6230383B2 JPS6230383B2 (ja) 1987-07-02

Family

ID=21968729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8007680A Granted JPS5622972A (en) 1979-06-22 1980-06-13 Method and device of electrical short test etc*

Country Status (6)

Country Link
US (1) US4290013A (ja)
EP (1) EP0021562B1 (ja)
JP (1) JPS5622972A (ja)
CA (1) CA1172699A (ja)
DE (1) DE3068344D1 (ja)
DK (1) DK263780A (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006242604A (ja) * 2005-02-28 2006-09-14 Sunx Ltd 短絡検出回路、検出センサ
JP2009244077A (ja) * 2008-03-31 2009-10-22 Nidec-Read Corp 基板検査装置及びその方法
JP2013024588A (ja) * 2011-07-15 2013-02-04 Hioki Ee Corp 回路基板検査装置および回路基板検査方法
JP2013202955A (ja) * 2012-03-28 2013-10-07 Japan Steel Works Ltd:The 射出成形機のヒータ断線検出方法
JP2015059840A (ja) * 2013-09-19 2015-03-30 日置電機株式会社 回路基板検査装置および回路基板検査方法

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458197A (en) * 1981-09-08 1984-07-03 The Boeing Company Apparatus and method for automatically testing a multiple node electrical circuit
US4459693A (en) * 1982-01-26 1984-07-10 Genrad, Inc. Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
US4785235A (en) * 1983-12-20 1988-11-15 Hewlett-Packard Company Shorts testing technique reducing phantom shorts problems
JPH02129682U (ja) * 1989-03-31 1990-10-25
JPH06225448A (ja) * 1992-12-04 1994-08-12 Fuji Electric Co Ltd 母線保護方法
US5546013A (en) * 1993-03-05 1996-08-13 International Business Machines Corporation Array tester for determining contact quality and line integrity in a TFT/LCD
US6185705B1 (en) * 1997-03-07 2001-02-06 Micron Technology, Inc. Method and apparatus for checking the resistance of programmable elements
US5952833A (en) 1997-03-07 1999-09-14 Micron Technology, Inc. Programmable voltage divider and method for testing the impedance of a programmable element
US6201383B1 (en) * 1998-01-22 2001-03-13 International Business Machines Corporation Method and apparatus for determining short circuit conditions using a gang probe circuit tester
US6424161B2 (en) * 1998-09-03 2002-07-23 Micron Technology, Inc. Apparatus and method for testing fuses
US6753688B2 (en) * 2001-04-10 2004-06-22 International Business Machines Corporation Interconnect package cluster probe short removal apparatus and method
GB2414864A (en) * 2004-06-01 2005-12-07 Nokia Corp Detecting short circuits
US8072834B2 (en) * 2005-08-25 2011-12-06 Cypress Semiconductor Corporation Line driver circuit and method with standby mode of operation
EP1835295A1 (en) * 2006-03-17 2007-09-19 3M Innovative Properties Company Test connector, kit and method for distinguishing a group of wires from other wires of a multi-wire cable
CN101701994B (zh) * 2009-11-13 2011-12-21 航天东方红卫星有限公司 一种低频电缆网络导通绝缘测试方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541599U (ja) * 1977-06-02 1979-01-08

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3492571A (en) * 1965-12-02 1970-01-27 Western Electric Co Apparatus for testing an electrical circuit for opens,shorts and cross connections with its terminal groups being sequentially connected to the apparatus
US3441849A (en) * 1967-01-13 1969-04-29 Ibm Testing and addressing apparatus for an array of circuit elements
US3528104A (en) * 1968-03-08 1970-09-08 Western Electric Co Bridge circuit methods of and apparatus for testing and locating faults in electrical circuits
US3784910A (en) * 1972-07-13 1974-01-08 Teradyne Inc Sequential addressing network testing system
US4114093A (en) * 1976-12-17 1978-09-12 Everett/Charles, Inc. Network testing method and apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541599U (ja) * 1977-06-02 1979-01-08

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006242604A (ja) * 2005-02-28 2006-09-14 Sunx Ltd 短絡検出回路、検出センサ
JP2009244077A (ja) * 2008-03-31 2009-10-22 Nidec-Read Corp 基板検査装置及びその方法
JP2013024588A (ja) * 2011-07-15 2013-02-04 Hioki Ee Corp 回路基板検査装置および回路基板検査方法
JP2013202955A (ja) * 2012-03-28 2013-10-07 Japan Steel Works Ltd:The 射出成形機のヒータ断線検出方法
JP2015059840A (ja) * 2013-09-19 2015-03-30 日置電機株式会社 回路基板検査装置および回路基板検査方法

Also Published As

Publication number Publication date
DE3068344D1 (en) 1984-08-02
EP0021562B1 (en) 1984-06-27
DK263780A (da) 1980-12-23
JPS6230383B2 (ja) 1987-07-02
CA1172699A (en) 1984-08-14
US4290013A (en) 1981-09-15
EP0021562A1 (en) 1981-01-07

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