JPS56153786A - Monitoring circuit for bias current of laser-diode - Google Patents

Monitoring circuit for bias current of laser-diode

Info

Publication number
JPS56153786A
JPS56153786A JP5618180A JP5618180A JPS56153786A JP S56153786 A JPS56153786 A JP S56153786A JP 5618180 A JP5618180 A JP 5618180A JP 5618180 A JP5618180 A JP 5618180A JP S56153786 A JPS56153786 A JP S56153786A
Authority
JP
Japan
Prior art keywords
comparator
output
temperature
diode
set value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5618180A
Other languages
Japanese (ja)
Inventor
Mitsuaki Nishie
Soichi Otaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP5618180A priority Critical patent/JPS56153786A/en
Publication of JPS56153786A publication Critical patent/JPS56153786A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE: To enable to monitor bias currents under a binary system of the output of a comparator by a method wherein a temperature sensing circuit is mounted which changes following the temperature characteristics of a laser diode, and the output of the temperature sensing circuit is forwarded to the comparator.
CONSTITUTION: When the temperaure of a laser diode LD changes to a low temperature from a high temperature, the resistance value of a sensor 2 increases. Thus, when bias current Io is within a proper value, the input of a comparator II is kept within a set value. Consequently, a LED4 of a normal condition displaying section III emits light. When the currents Io exceed the proper value, on the other hand, the input of the comparator II also exceeds the set value. as a result, the LED7 of an abnormal condition displaying section IV emits light. In this case, a bias circuit of the diode LD decreases the current Io because a feedback circuit flowing the proper currents Io in response to temperature is installed, thus hardly changing the output of a temperature sensing circuit I, then keeping the output within the set value. Accordingly, the quality of a function of the feedback circuit can be determined by monitoring the adequacy of the Io current.
COPYRIGHT: (C)1981,JPO&Japio
JP5618180A 1980-04-30 1980-04-30 Monitoring circuit for bias current of laser-diode Pending JPS56153786A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5618180A JPS56153786A (en) 1980-04-30 1980-04-30 Monitoring circuit for bias current of laser-diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5618180A JPS56153786A (en) 1980-04-30 1980-04-30 Monitoring circuit for bias current of laser-diode

Publications (1)

Publication Number Publication Date
JPS56153786A true JPS56153786A (en) 1981-11-27

Family

ID=13019929

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5618180A Pending JPS56153786A (en) 1980-04-30 1980-04-30 Monitoring circuit for bias current of laser-diode

Country Status (1)

Country Link
JP (1) JPS56153786A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58107692A (en) * 1981-12-21 1983-06-27 Konishiroku Photo Ind Co Ltd Protecting method for semiconductor laser
JPS61100162U (en) * 1984-12-07 1986-06-26
JPS61143053A (en) * 1984-12-17 1986-06-30 富士電機株式会社 Laser medical device
JPS6282758U (en) * 1985-05-10 1987-05-27
JPS62146012A (en) * 1985-12-20 1987-06-30 Omron Tateisi Electronics Co Photoelectric switch
JPH02122463U (en) * 1989-03-20 1990-10-08
JPH04334078A (en) * 1991-05-10 1992-11-20 Fujitsu Ltd Semiconductor laser controlling equipment
JP2002076506A (en) * 2000-08-30 2002-03-15 Nec Corp Method and device for detecting abnormality of optical module

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52123185A (en) * 1976-04-09 1977-10-17 Fujitsu Ltd Optical communication supervisory system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52123185A (en) * 1976-04-09 1977-10-17 Fujitsu Ltd Optical communication supervisory system

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58107692A (en) * 1981-12-21 1983-06-27 Konishiroku Photo Ind Co Ltd Protecting method for semiconductor laser
JPS61100162U (en) * 1984-12-07 1986-06-26
JPS61143053A (en) * 1984-12-17 1986-06-30 富士電機株式会社 Laser medical device
JPS6282758U (en) * 1985-05-10 1987-05-27
JPS62146012A (en) * 1985-12-20 1987-06-30 Omron Tateisi Electronics Co Photoelectric switch
JPH02122463U (en) * 1989-03-20 1990-10-08
JPH04334078A (en) * 1991-05-10 1992-11-20 Fujitsu Ltd Semiconductor laser controlling equipment
US5334826A (en) * 1991-05-10 1994-08-02 Fujitsu Limited Method and apparatus for extending and confirming the service life of semiconductor laser of bar code reader by detecting current increase corresponding to temperature of semiconductor laser
JP2002076506A (en) * 2000-08-30 2002-03-15 Nec Corp Method and device for detecting abnormality of optical module

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