JPS56153229A - Method and device for measurement of stress - Google Patents

Method and device for measurement of stress

Info

Publication number
JPS56153229A
JPS56153229A JP5669180A JP5669180A JPS56153229A JP S56153229 A JPS56153229 A JP S56153229A JP 5669180 A JP5669180 A JP 5669180A JP 5669180 A JP5669180 A JP 5669180A JP S56153229 A JPS56153229 A JP S56153229A
Authority
JP
Japan
Prior art keywords
circuit
sample
signal
camera
converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5669180A
Other languages
English (en)
Japanese (ja)
Other versions
JPS621204B2 (enrdf_load_stackoverflow
Inventor
Akihisa Masuki
Mamoru Irizuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP5669180A priority Critical patent/JPS56153229A/ja
Publication of JPS56153229A publication Critical patent/JPS56153229A/ja
Publication of JPS621204B2 publication Critical patent/JPS621204B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/248—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet using infrared

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP5669180A 1980-04-28 1980-04-28 Method and device for measurement of stress Granted JPS56153229A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5669180A JPS56153229A (en) 1980-04-28 1980-04-28 Method and device for measurement of stress

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5669180A JPS56153229A (en) 1980-04-28 1980-04-28 Method and device for measurement of stress

Publications (2)

Publication Number Publication Date
JPS56153229A true JPS56153229A (en) 1981-11-27
JPS621204B2 JPS621204B2 (enrdf_load_stackoverflow) 1987-01-12

Family

ID=13034467

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5669180A Granted JPS56153229A (en) 1980-04-28 1980-04-28 Method and device for measurement of stress

Country Status (1)

Country Link
JP (1) JPS56153229A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5556692A (en) * 1978-10-20 1980-04-25 Matsushita Electric Ind Co Ltd Method of mounting electronic part

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5556692A (en) * 1978-10-20 1980-04-25 Matsushita Electric Ind Co Ltd Method of mounting electronic part

Also Published As

Publication number Publication date
JPS621204B2 (enrdf_load_stackoverflow) 1987-01-12

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