JPS56142427A - Device for displaying temperature change rate - Google Patents

Device for displaying temperature change rate

Info

Publication number
JPS56142427A
JPS56142427A JP4599780A JP4599780A JPS56142427A JP S56142427 A JPS56142427 A JP S56142427A JP 4599780 A JP4599780 A JP 4599780A JP 4599780 A JP4599780 A JP 4599780A JP S56142427 A JPS56142427 A JP S56142427A
Authority
JP
Japan
Prior art keywords
signals
temperature change
change rate
terminal
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4599780A
Other languages
Japanese (ja)
Inventor
Atsushi Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4599780A priority Critical patent/JPS56142427A/en
Publication of JPS56142427A publication Critical patent/JPS56142427A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0803—Arrangements for time-dependent attenuation of radiation signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/025—Interfacing a pyrometer to an external device or network; User interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J2005/066—Differential arrangement, i.e. sensitive/not sensitive

Abstract

PURPOSE:To make possible to observe a temperature change rate quantitatively over an entire range by subtracting a thermal image signal at a certain accumulated time from a thermal image signal after a certain time in the element-to-element relation of the images and making display corresponding to difference signals. CONSTITUTION:The digitized signals of a thermal image detected by infra-red ray scanning input to a terminal 1 are stored in a memory 3 by the action of scanning synchronizing signals from a terminal 2 and an address control circuit 4. Next, after a certain time, signals are given to the terminal 1 in the same way, the difference signals of the new and the old signals are taken out by a substractor 6 or the like and stored in a memory 7. Corresponding to the intensity of the difference signals stored, display with lights and shades or in various colors is displayed by a black and white displayer 9 or a color displayer 12. By so doing, the temperature change rate of a measured object can be observed quantitatively over the entire range of the measured object.
JP4599780A 1980-04-08 1980-04-08 Device for displaying temperature change rate Pending JPS56142427A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4599780A JPS56142427A (en) 1980-04-08 1980-04-08 Device for displaying temperature change rate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4599780A JPS56142427A (en) 1980-04-08 1980-04-08 Device for displaying temperature change rate

Publications (1)

Publication Number Publication Date
JPS56142427A true JPS56142427A (en) 1981-11-06

Family

ID=12734735

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4599780A Pending JPS56142427A (en) 1980-04-08 1980-04-08 Device for displaying temperature change rate

Country Status (1)

Country Link
JP (1) JPS56142427A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6192839U (en) * 1984-11-21 1986-06-16
JPH0527637U (en) * 1991-09-20 1993-04-09 日本電気三栄株式会社 Infrared radiation temperature measurement device
US5246291A (en) * 1992-06-01 1993-09-21 Motorola, Inc. Bond inspection technique for a semiconductor chip

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6192839U (en) * 1984-11-21 1986-06-16
JPH0527637U (en) * 1991-09-20 1993-04-09 日本電気三栄株式会社 Infrared radiation temperature measurement device
US5246291A (en) * 1992-06-01 1993-09-21 Motorola, Inc. Bond inspection technique for a semiconductor chip

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