JPS56147078A - Half-wave extending system - Google Patents

Half-wave extending system

Info

Publication number
JPS56147078A
JPS56147078A JP5066080A JP5066080A JPS56147078A JP S56147078 A JPS56147078 A JP S56147078A JP 5066080 A JP5066080 A JP 5066080A JP 5066080 A JP5066080 A JP 5066080A JP S56147078 A JPS56147078 A JP S56147078A
Authority
JP
Japan
Prior art keywords
extending system
wave extending
wave
extending
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5066080A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6239709B2 (cs
Inventor
Akira Morita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP5066080A priority Critical patent/JPS56147078A/ja
Publication of JPS56147078A publication Critical patent/JPS56147078A/ja
Publication of JPS6239709B2 publication Critical patent/JPS6239709B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
    • G01R31/3333—Apparatus, systems or circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
JP5066080A 1980-04-17 1980-04-17 Half-wave extending system Granted JPS56147078A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5066080A JPS56147078A (en) 1980-04-17 1980-04-17 Half-wave extending system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5066080A JPS56147078A (en) 1980-04-17 1980-04-17 Half-wave extending system

Publications (2)

Publication Number Publication Date
JPS56147078A true JPS56147078A (en) 1981-11-14
JPS6239709B2 JPS6239709B2 (cs) 1987-08-25

Family

ID=12865099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5066080A Granted JPS56147078A (en) 1980-04-17 1980-04-17 Half-wave extending system

Country Status (1)

Country Link
JP (1) JPS56147078A (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102759710A (zh) * 2012-07-27 2012-10-31 苏州贝腾特电子科技有限公司 改进型检测设备

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS501820A (cs) * 1973-04-26 1975-01-09

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS501820A (cs) * 1973-04-26 1975-01-09

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102759710A (zh) * 2012-07-27 2012-10-31 苏州贝腾特电子科技有限公司 改进型检测设备

Also Published As

Publication number Publication date
JPS6239709B2 (cs) 1987-08-25

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