JPS56143962A - Measuring device for frequency discriminator - Google Patents

Measuring device for frequency discriminator

Info

Publication number
JPS56143962A
JPS56143962A JP4761980A JP4761980A JPS56143962A JP S56143962 A JPS56143962 A JP S56143962A JP 4761980 A JP4761980 A JP 4761980A JP 4761980 A JP4761980 A JP 4761980A JP S56143962 A JPS56143962 A JP S56143962A
Authority
JP
Japan
Prior art keywords
demodulator
frequency discriminator
measuring device
frequency
differences
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4761980A
Other languages
Japanese (ja)
Other versions
JPH0114547B2 (en
Inventor
Mitsutoshi Sugawara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4761980A priority Critical patent/JPS56143962A/en
Publication of JPS56143962A publication Critical patent/JPS56143962A/en
Publication of JPH0114547B2 publication Critical patent/JPH0114547B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/15—Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To perform highly accurate measurement of frequency discriminators such as FM demodulators easily in a short time by applying plural frequency signals and measuring output differences. CONSTITUTION:The different frequency signals from crystal oscillators etc. 1-3 are successively applied to a frequency discriminator such as FM demodulator 5 via a change-over switch 4. The outputs of the demodulator 5 are measured with a DC voltmeter 6 and based on the differences in the measured values, the measurement of the demodulator 5 is accomplished easily, quickly and highly accurately.
JP4761980A 1980-04-11 1980-04-11 Measuring device for frequency discriminator Granted JPS56143962A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4761980A JPS56143962A (en) 1980-04-11 1980-04-11 Measuring device for frequency discriminator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4761980A JPS56143962A (en) 1980-04-11 1980-04-11 Measuring device for frequency discriminator

Publications (2)

Publication Number Publication Date
JPS56143962A true JPS56143962A (en) 1981-11-10
JPH0114547B2 JPH0114547B2 (en) 1989-03-13

Family

ID=12780225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4761980A Granted JPS56143962A (en) 1980-04-11 1980-04-11 Measuring device for frequency discriminator

Country Status (1)

Country Link
JP (1) JPS56143962A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5958373U (en) * 1982-10-11 1984-04-16 アンリツ株式会社 Standard signal generator
CN104198846A (en) * 2014-08-18 2014-12-10 广东大普通信技术有限公司 Automatic testing method and system of aging characteristics of crystal oscillator

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS524276A (en) * 1975-06-30 1977-01-13 Nec Corp Two-signal distortion measuring circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS524276A (en) * 1975-06-30 1977-01-13 Nec Corp Two-signal distortion measuring circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5958373U (en) * 1982-10-11 1984-04-16 アンリツ株式会社 Standard signal generator
JPH02696Y2 (en) * 1982-10-11 1990-01-09
CN104198846A (en) * 2014-08-18 2014-12-10 广东大普通信技术有限公司 Automatic testing method and system of aging characteristics of crystal oscillator

Also Published As

Publication number Publication date
JPH0114547B2 (en) 1989-03-13

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