JPS56142453A - Magnetic single crystal defect inspecting method - Google Patents

Magnetic single crystal defect inspecting method

Info

Publication number
JPS56142453A
JPS56142453A JP4667880A JP4667880A JPS56142453A JP S56142453 A JPS56142453 A JP S56142453A JP 4667880 A JP4667880 A JP 4667880A JP 4667880 A JP4667880 A JP 4667880A JP S56142453 A JPS56142453 A JP S56142453A
Authority
JP
Japan
Prior art keywords
magnetic field
magnetic
single crystal
signal
inspection position
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4667880A
Other languages
Japanese (ja)
Inventor
Kozaburo Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4667880A priority Critical patent/JPS56142453A/en
Publication of JPS56142453A publication Critical patent/JPS56142453A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To enable even an extremely small valve material to obtain an adequate output capacity, by reversing defective magnetization by locally impressed magnetic field and utilizing the characteristic of expansion of the reversed magnetic field for detection of defect. CONSTITUTION:A magnetic single crystal 6 to be inspected is placed on a shifting table 4. The shifting table 4 is connected to a potentiometer 5 so that inspection position is able to be traced by an XY recorder 16. The magnetic single crystal 6 is given, by the first magnetic field impressing step 7 and a magnetic field impressing power source 8, a magnetic field capable of being held in a single magnetic field. The second magnetic field impressing step 9, which impresses local magnetic fields to inspection position, generates pulselike magnetic field in the direction opposite to the direction of the magnetic field of the first magnetic field impressing step 7. The signal indicating presence or absence of reversion of magnetic field of inspection position is detected by a light source 11, a polarizer 12, a detector 13 and a photomultiplier 14, and the signal is converted to ON-OFF signal by a signal converter 15, and then , it is connected to the XY recorder 16 for being recorded.
JP4667880A 1980-04-09 1980-04-09 Magnetic single crystal defect inspecting method Pending JPS56142453A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4667880A JPS56142453A (en) 1980-04-09 1980-04-09 Magnetic single crystal defect inspecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4667880A JPS56142453A (en) 1980-04-09 1980-04-09 Magnetic single crystal defect inspecting method

Publications (1)

Publication Number Publication Date
JPS56142453A true JPS56142453A (en) 1981-11-06

Family

ID=12754027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4667880A Pending JPS56142453A (en) 1980-04-09 1980-04-09 Magnetic single crystal defect inspecting method

Country Status (1)

Country Link
JP (1) JPS56142453A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS64477A (en) * 1987-06-23 1989-01-05 Hitachi Ltd Device for observing magnetization state of magnetic material
JP2007033357A (en) * 2005-07-29 2007-02-08 Sumitomo Metal Mining Co Ltd Method of evaluating magneto-optical device
JP2012013710A (en) * 2011-08-18 2012-01-19 Sumitomo Metal Mining Co Ltd Method of evaluating magneto-optical device
JP2013130452A (en) * 2011-12-21 2013-07-04 Shikoku Res Inst Inc Nondestructive inspection method and nondestructive inspection device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS64477A (en) * 1987-06-23 1989-01-05 Hitachi Ltd Device for observing magnetization state of magnetic material
JP2007033357A (en) * 2005-07-29 2007-02-08 Sumitomo Metal Mining Co Ltd Method of evaluating magneto-optical device
JP2012013710A (en) * 2011-08-18 2012-01-19 Sumitomo Metal Mining Co Ltd Method of evaluating magneto-optical device
JP2013130452A (en) * 2011-12-21 2013-07-04 Shikoku Res Inst Inc Nondestructive inspection method and nondestructive inspection device

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