JPS56142404A - System for measuring plate width - Google Patents

System for measuring plate width

Info

Publication number
JPS56142404A
JPS56142404A JP4668180A JP4668180A JPS56142404A JP S56142404 A JPS56142404 A JP S56142404A JP 4668180 A JP4668180 A JP 4668180A JP 4668180 A JP4668180 A JP 4668180A JP S56142404 A JPS56142404 A JP S56142404A
Authority
JP
Japan
Prior art keywords
plate width
metal plate
plate
edges
width data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4668180A
Other languages
Japanese (ja)
Inventor
Nobuo Nishikawa
Shuji Onaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4668180A priority Critical patent/JPS56142404A/en
Publication of JPS56142404A publication Critical patent/JPS56142404A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To make possible to measure the widths of aluminum plates, etc., noncontactly and continuously at high speeds and high accuracy by correcting plate width data obtained by receiving reflected light from edges with CCD cameras for a height measured by means of the reflection of laser beams. CONSTITUTION:By disposing light sources above, on the sides of, or under a metal plate 1, an object to be measured, reflected light from both edges 4 and 5 of the metal plate 1 or transmitted light is received with plural CCD cameras 6 and 7 installed above the plate. By detecting the addresses of the edges in detection signals by image sensors 12 and 13 in the cameras 6 and 7, plate width data are determined. From an obliquely upper point, laser light 9 formed into a linear beam via a cylindrical lens is projected to the upper surface of the metal plate 1, and by measuring the height of the upper surface of the metal plate 1 from the address of detection signals received by a CCD camera 11 installed obliquely above on the opposite side, height correction is added to said plate width data and the true value of plate width W0 is obtained.
JP4668180A 1980-04-09 1980-04-09 System for measuring plate width Pending JPS56142404A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4668180A JPS56142404A (en) 1980-04-09 1980-04-09 System for measuring plate width

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4668180A JPS56142404A (en) 1980-04-09 1980-04-09 System for measuring plate width

Publications (1)

Publication Number Publication Date
JPS56142404A true JPS56142404A (en) 1981-11-06

Family

ID=12754115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4668180A Pending JPS56142404A (en) 1980-04-09 1980-04-09 System for measuring plate width

Country Status (1)

Country Link
JP (1) JPS56142404A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63221208A (en) * 1987-03-10 1988-09-14 Nippon Steel Corp Method for detecting in-furnance running state of strip
JPH03115804U (en) * 1990-03-14 1991-12-02
JPH04344410A (en) * 1991-05-22 1992-12-01 Showa Alum Corp Method for automatically measuring sectional dimension of long workpiece
WO2000033024A1 (en) * 1998-12-03 2000-06-08 Technowave, Ltd. Information reader
KR20000074247A (en) * 1999-05-19 2000-12-15 이구택 Method of measuring width of slab using inclined ccd camera
KR20030085291A (en) * 2002-04-30 2003-11-05 주식회사 포스코 Width Measuring Device and Method using Laser Beam
JP2007205926A (en) * 2006-02-02 2007-08-16 Ricoh Co Ltd Surface defect inspection device, surface defect inspection method, and surface defect inspection program
JP2007271446A (en) * 2006-03-31 2007-10-18 Meidensha Corp Instrument for measuring abrasion in trolley wire by imaging processing
US20100112112A1 (en) * 2007-03-01 2010-05-06 Jan Kornelis Grashuis Device for manufacturing a rubber strip
KR100979034B1 (en) 2003-09-01 2010-08-30 주식회사 포스코 An apparatus for detecting the width and defect of steel plate by using linear laser
WO2013011586A1 (en) * 2011-07-21 2013-01-24 株式会社ニレコ Apparatus for detecting end portion position of strip-like body, and method for detecting end portion position of strip-like body
JP2017531783A (en) * 2015-09-22 2017-10-26 三菱電機株式会社 Absolute encoder

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4974967A (en) * 1972-11-18 1974-07-19
JPS52114353A (en) * 1976-03-22 1977-09-26 Daikin Ind Ltd Optical detector for mocing body

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4974967A (en) * 1972-11-18 1974-07-19
JPS52114353A (en) * 1976-03-22 1977-09-26 Daikin Ind Ltd Optical detector for mocing body

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63221208A (en) * 1987-03-10 1988-09-14 Nippon Steel Corp Method for detecting in-furnance running state of strip
JPH03115804U (en) * 1990-03-14 1991-12-02
JPH04344410A (en) * 1991-05-22 1992-12-01 Showa Alum Corp Method for automatically measuring sectional dimension of long workpiece
WO2000033024A1 (en) * 1998-12-03 2000-06-08 Technowave, Ltd. Information reader
KR20000074247A (en) * 1999-05-19 2000-12-15 이구택 Method of measuring width of slab using inclined ccd camera
KR20030085291A (en) * 2002-04-30 2003-11-05 주식회사 포스코 Width Measuring Device and Method using Laser Beam
KR100979034B1 (en) 2003-09-01 2010-08-30 주식회사 포스코 An apparatus for detecting the width and defect of steel plate by using linear laser
JP2007205926A (en) * 2006-02-02 2007-08-16 Ricoh Co Ltd Surface defect inspection device, surface defect inspection method, and surface defect inspection program
JP2007271446A (en) * 2006-03-31 2007-10-18 Meidensha Corp Instrument for measuring abrasion in trolley wire by imaging processing
US20100112112A1 (en) * 2007-03-01 2010-05-06 Jan Kornelis Grashuis Device for manufacturing a rubber strip
US8585389B2 (en) * 2007-03-01 2013-11-19 Vmi Holland B.V. Device for manufacturing a rubber strip
WO2013011586A1 (en) * 2011-07-21 2013-01-24 株式会社ニレコ Apparatus for detecting end portion position of strip-like body, and method for detecting end portion position of strip-like body
JPWO2013011586A1 (en) * 2011-07-21 2015-02-23 株式会社ニレコ End position detection device for strip and end position detection method for strip
JP2017531783A (en) * 2015-09-22 2017-10-26 三菱電機株式会社 Absolute encoder

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