JPS56138256A - Semiconductor testing device - Google Patents

Semiconductor testing device

Info

Publication number
JPS56138256A
JPS56138256A JP4164880A JP4164880A JPS56138256A JP S56138256 A JPS56138256 A JP S56138256A JP 4164880 A JP4164880 A JP 4164880A JP 4164880 A JP4164880 A JP 4164880A JP S56138256 A JPS56138256 A JP S56138256A
Authority
JP
Japan
Prior art keywords
subroutine
pointer
stack
contents
multiplexer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4164880A
Other languages
Japanese (ja)
Inventor
Tsutomu Miyazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIYOU LSI GIJUTSU KENKYU KUMIAI
CHO LSI GIJUTSU KENKYU KUMIAI
Original Assignee
CHIYOU LSI GIJUTSU KENKYU KUMIAI
CHO LSI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIYOU LSI GIJUTSU KENKYU KUMIAI, CHO LSI GIJUTSU KENKYU KUMIAI filed Critical CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority to JP4164880A priority Critical patent/JPS56138256A/en
Publication of JPS56138256A publication Critical patent/JPS56138256A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Executing Machine-Instructions (AREA)

Abstract

PURPOSE:To easily execute programming and bedug by constituting so as to operate normally even when a new subroutine is called from the subroutine of a matching mode. CONSTITUTION:When a matching mode is detected by the subroutine mode detection circuit 12, the contents of one stack pointer 11 are transferred to the other stack pointer 14. And, the contents of two pointers 11, 14 are sent to the control counter save stack 6 and the subroutine return address stack 10 through the pointer multiplexer 15. In this case, at the time of execution of a matching subroutine, the pointer multiplexer control circuit 16 controls switching so that the multiplexer 15 can selects the contents of the other pointer 14 when a data has matched. According to such a constitution, since a program can be shortened, the programming and debug are executed easily.
JP4164880A 1980-03-31 1980-03-31 Semiconductor testing device Pending JPS56138256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4164880A JPS56138256A (en) 1980-03-31 1980-03-31 Semiconductor testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4164880A JPS56138256A (en) 1980-03-31 1980-03-31 Semiconductor testing device

Publications (1)

Publication Number Publication Date
JPS56138256A true JPS56138256A (en) 1981-10-28

Family

ID=12614158

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4164880A Pending JPS56138256A (en) 1980-03-31 1980-03-31 Semiconductor testing device

Country Status (1)

Country Link
JP (1) JPS56138256A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5887478A (en) * 1981-11-20 1983-05-25 Natl Space Dev Agency Japan<Nasda> Analyzing device for picture of synthetic aperture radar

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5887478A (en) * 1981-11-20 1983-05-25 Natl Space Dev Agency Japan<Nasda> Analyzing device for picture of synthetic aperture radar

Similar Documents

Publication Publication Date Title
JPS56138256A (en) Semiconductor testing device
JPS56153457A (en) Measuring device for computer load
JPS55119755A (en) Processor providing test instruction function
JPS57776A (en) Display system for status
JPS5668863A (en) Operating device
JPS5585910A (en) Control unit for robot
JPS54133858A (en) Address detector of computer
JPS57139802A (en) Switching device
JPS54139446A (en) Process mode control unit
JPS5663627A (en) Input/output control device
JPS55164905A (en) Programmable sequencer
JPS54124650A (en) Computer
JPS5668865A (en) Instruction control system
JPS5657139A (en) Console device
JPS5668862A (en) Data processing device
JPS54130851A (en) Data processing unit
JPS57108940A (en) Test processing system for operating system
JPS56132635A (en) Communication controlling device
JPS5453842A (en) Program run control circuit
JPS6476236A (en) Simulator device with pseudo-operating function of input/ output device
JPS57132255A (en) Program tracing system
JPS55129839A (en) Program inspection unit
JPS5686345A (en) Automatic measuring instrument for moisture content built-in with testing means
JPS6425247A (en) Microprocessor
JPS5567689A (en) Time generator