JPS5612544A - Method and apparatus for detecting cracking in shell of blast furnace - Google Patents
Method and apparatus for detecting cracking in shell of blast furnaceInfo
- Publication number
- JPS5612544A JPS5612544A JP8088579A JP8088579A JPS5612544A JP S5612544 A JPS5612544 A JP S5612544A JP 8088579 A JP8088579 A JP 8088579A JP 8088579 A JP8088579 A JP 8088579A JP S5612544 A JPS5612544 A JP S5612544A
- Authority
- JP
- Japan
- Prior art keywords
- shell
- electrodes
- blast furnace
- potential difference
- electric current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
PURPOSE: To electrically detect any cracking in the shell of blast furnace by circulating an electric current through the body of the shell between two electrodes across the defective part of the shell, measuring the potential difference between the electrodes and evaluating the deviation of the potential difference from a reference value.
CONSTITUTION: A multiplicity of electrodes A1WA4 are arranged on the objective surface of the shell 1 of the blast furnace in a checkerboard-like manner. The electrodes A1WA4 are connected to a power supply 2 and a galvanometer 3 in the illustrated manner. By a suitable switching operation, four adjacent electrodes arrayed in a row are used as a unit. A predetermined level of electric current is made to flow between two outermost electrodes A1 and A4 through the shell 1, and the potential difference between two inner electrodes A2 and A3 is measured. Then, by a switching operation, four adjacent electrodes starting from the second one are connected in the illustrated manner, and the same measurement is effected with this new unit. This operation is repeated while making a shift by one pitch in the vertical and horizontal directions to scan the entire surface of the shell 1.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8088579A JPS5612544A (en) | 1979-06-26 | 1979-06-26 | Method and apparatus for detecting cracking in shell of blast furnace |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8088579A JPS5612544A (en) | 1979-06-26 | 1979-06-26 | Method and apparatus for detecting cracking in shell of blast furnace |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5612544A true JPS5612544A (en) | 1981-02-06 |
Family
ID=13730790
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8088579A Pending JPS5612544A (en) | 1979-06-26 | 1979-06-26 | Method and apparatus for detecting cracking in shell of blast furnace |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5612544A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007003235A (en) * | 2005-06-21 | 2007-01-11 | Atlus:Kk | Non-destructive inspection method of change in wall thickness of measuring target |
| EP3542155A4 (en) * | 2016-11-16 | 2020-08-26 | 3M Innovative Properties Company | Electrode placement for verifying structural integrity of materials |
| US10816495B2 (en) | 2016-12-16 | 2020-10-27 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| JP2021503591A (en) * | 2018-11-02 | 2021-02-12 | ハンズ レーザー テクノロジー インダストリー グループ カンパニー リミテッド | Quality inspection equipment, methods, systems and integrated probe assemblies |
| US11060993B2 (en) | 2016-11-16 | 2021-07-13 | 3M Innovative Properties Company | Suppressing thermally induced voltages for verifying structural integrity of materials |
| US11105762B2 (en) | 2016-12-16 | 2021-08-31 | 3M Innovative Properties Company | Verifying structural integrity of materials using reference impedance |
| US11112374B2 (en) | 2016-12-16 | 2021-09-07 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| US11181498B2 (en) | 2016-11-16 | 2021-11-23 | 3M Innovative Propperties Company | Temperature-independent verifying of structural integrity of materials using electrical properties |
| US11255807B2 (en) | 2016-11-16 | 2022-02-22 | 3M Innovative Properties Company | Verifying structural integrity of materials |
-
1979
- 1979-06-26 JP JP8088579A patent/JPS5612544A/en active Pending
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007003235A (en) * | 2005-06-21 | 2007-01-11 | Atlus:Kk | Non-destructive inspection method of change in wall thickness of measuring target |
| US11181498B2 (en) | 2016-11-16 | 2021-11-23 | 3M Innovative Propperties Company | Temperature-independent verifying of structural integrity of materials using electrical properties |
| EP3542155A4 (en) * | 2016-11-16 | 2020-08-26 | 3M Innovative Properties Company | Electrode placement for verifying structural integrity of materials |
| US11609202B2 (en) | 2016-11-16 | 2023-03-21 | 3M Innovative Properties Company | Electrode placement for verifying structural integrity of materials |
| US11609203B2 (en) | 2016-11-16 | 2023-03-21 | 3M Innovative Properties Company | Suppressing thermally induced voltages for verifying structural integrity of materials |
| US10983081B2 (en) | 2016-11-16 | 2021-04-20 | 3M Innovative Properties Company | Electrode placement for verifying structural integrity of materials |
| US11060993B2 (en) | 2016-11-16 | 2021-07-13 | 3M Innovative Properties Company | Suppressing thermally induced voltages for verifying structural integrity of materials |
| US11255807B2 (en) | 2016-11-16 | 2022-02-22 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| US11105762B2 (en) | 2016-12-16 | 2021-08-31 | 3M Innovative Properties Company | Verifying structural integrity of materials using reference impedance |
| US11112374B2 (en) | 2016-12-16 | 2021-09-07 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| US11371952B2 (en) | 2016-12-16 | 2022-06-28 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| US10816495B2 (en) | 2016-12-16 | 2020-10-27 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| JP2021503591A (en) * | 2018-11-02 | 2021-02-12 | ハンズ レーザー テクノロジー インダストリー グループ カンパニー リミテッド | Quality inspection equipment, methods, systems and integrated probe assemblies |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ES8401630A1 (en) | Method and apparatus for electrically investigating a borehole. | |
| JPS5612544A (en) | Method and apparatus for detecting cracking in shell of blast furnace | |
| JPS5940588A (en) | Detecting device for abnormal solar battery element | |
| AT365838B (en) | ULTRASONIC TEST PROBE FOR DETECTING DEFECTIVE FUEL ELEMENTS IN A WATER-COOLED CORE REACTOR | |
| JPS5679246A (en) | Method and apparatus for detecting oxygen concentration | |
| DE3266095D1 (en) | Method and apparatus for detecting damaged fuel rods | |
| JPS57108761A (en) | Measuring method for soil of insulator | |
| CN103015974A (en) | Measuring probe of oil-base mud logger | |
| JPS5582039A (en) | Evaluation method of soldering and its unit | |
| JPS5571034A (en) | Measuring method for resistance distribution of compound semiconductor single crystal | |
| ES421439A1 (en) | Method and apparatus for detecting incipient short circuit conditions in electrolytic cells | |
| SU1682761A1 (en) | Method of inspection of metallic tube geometrical parameters | |
| JPS53105192A (en) | Test equipment for liquid crystal display element | |
| JPS531584A (en) | Ultrasonic flaw detector | |
| JPS57115843A (en) | Testing device for wafer | |
| JPS54102978A (en) | Test method for semiconductor element | |
| SU402830A1 (en) | 5PT B | |
| JPS5412840A (en) | Measuring method for surface potential of electrophotographic photoreceptor by time series | |
| JPS53104179A (en) | Wafer prober | |
| JPS5669549A (en) | Metal exposure inspecting method of empty can and multichannel system device | |
| JPS56113898A (en) | Double shell type low-temperature tank provided with gondola for security inspection and appropriate inspecting method | |
| JPS56103875A (en) | Method for judging deterioration of lead acid battery | |
| JPS5338344A (en) | Repetitive interrupted current life testing method of electric apparatus | |
| SEDYKH | Theoretical-game optimization of dielectric nondestructive inspection | |
| JPS558848A (en) | Detecting flowing condition in fluidized layer |