JPS56124006A - Measuring method for flatness of plane plate - Google Patents

Measuring method for flatness of plane plate

Info

Publication number
JPS56124006A
JPS56124006A JP1314980A JP1314980A JPS56124006A JP S56124006 A JPS56124006 A JP S56124006A JP 1314980 A JP1314980 A JP 1314980A JP 1314980 A JP1314980 A JP 1314980A JP S56124006 A JPS56124006 A JP S56124006A
Authority
JP
Japan
Prior art keywords
picked
light
picture
width
pickup device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1314980A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6134601B2 (enExample
Inventor
Kiyohiko Kawaguchi
Kiyotaka Inada
Tomoaki Kawabata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP1314980A priority Critical patent/JPS56124006A/ja
Publication of JPS56124006A publication Critical patent/JPS56124006A/ja
Publication of JPS6134601B2 publication Critical patent/JPS6134601B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP1314980A 1980-02-05 1980-02-05 Measuring method for flatness of plane plate Granted JPS56124006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1314980A JPS56124006A (en) 1980-02-05 1980-02-05 Measuring method for flatness of plane plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1314980A JPS56124006A (en) 1980-02-05 1980-02-05 Measuring method for flatness of plane plate

Publications (2)

Publication Number Publication Date
JPS56124006A true JPS56124006A (en) 1981-09-29
JPS6134601B2 JPS6134601B2 (enExample) 1986-08-08

Family

ID=11825099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1314980A Granted JPS56124006A (en) 1980-02-05 1980-02-05 Measuring method for flatness of plane plate

Country Status (1)

Country Link
JP (1) JPS56124006A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63274806A (ja) * 1987-05-01 1988-11-11 Nippon Steel Corp 連続焼鈍炉におけるストリップの形状検出方法
JPH112511A (ja) * 1997-03-11 1999-01-06 Betrieps Forsch Vdeh Inst Angew Forsch Gmbh 金属ストリップ用平面度測定システム
WO2024190031A1 (ja) 2023-03-10 2024-09-19 Ｊｆｅスチール株式会社 帯状物体の形状測定方法、帯状物体の形状制御方法、帯状物体の製造方法、帯状物体の品質管理方法、帯状物体の形状測定装置および帯状物体の製造設備
WO2024190035A1 (ja) 2023-03-10 2024-09-19 Ｊｆｅスチール株式会社 帯状物体の形状測定方法、帯状物体の形状制御方法、帯状物体の製造方法、帯状物体の品質管理方法、帯状物体の形状測定装置および帯状物体の製造設備

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63274806A (ja) * 1987-05-01 1988-11-11 Nippon Steel Corp 連続焼鈍炉におけるストリップの形状検出方法
JPH112511A (ja) * 1997-03-11 1999-01-06 Betrieps Forsch Vdeh Inst Angew Forsch Gmbh 金属ストリップ用平面度測定システム
WO2024190031A1 (ja) 2023-03-10 2024-09-19 Ｊｆｅスチール株式会社 帯状物体の形状測定方法、帯状物体の形状制御方法、帯状物体の製造方法、帯状物体の品質管理方法、帯状物体の形状測定装置および帯状物体の製造設備
WO2024190035A1 (ja) 2023-03-10 2024-09-19 Ｊｆｅスチール株式会社 帯状物体の形状測定方法、帯状物体の形状制御方法、帯状物体の製造方法、帯状物体の品質管理方法、帯状物体の形状測定装置および帯状物体の製造設備
KR20250139388A (ko) 2023-03-10 2025-09-23 제이에프이 스틸 가부시키가이샤 띠형상 물체의 형상 측정 방법, 띠형상 물체의 형상 제어 방법, 띠형상 물체의 제조 방법, 띠형상 물체의 품질 관리 방법, 띠형상 물체의 형상 측정 장치 및 띠형상 물체의 제조 설비
KR20250139387A (ko) 2023-03-10 2025-09-23 제이에프이 스틸 가부시키가이샤 띠형상 물체의 형상 측정 방법, 띠형상 물체의 형상 제어 방법, 띠형상 물체의 제조 방법, 띠형상 물체의 품질 관리 방법, 띠형상 물체의 형상 측정 장치 및 띠형상 물체의 제조 설비

Also Published As

Publication number Publication date
JPS6134601B2 (enExample) 1986-08-08

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