JPS56115960A - Electric resistance measuring apparatus - Google Patents
Electric resistance measuring apparatusInfo
- Publication number
- JPS56115960A JPS56115960A JP1854880A JP1854880A JPS56115960A JP S56115960 A JPS56115960 A JP S56115960A JP 1854880 A JP1854880 A JP 1854880A JP 1854880 A JP1854880 A JP 1854880A JP S56115960 A JPS56115960 A JP S56115960A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- circuit
- current
- converter
- difference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE:To make it possible to remove the noise of the inductive voltage or the thermoelectromotive force for counting out the correct resistance value by making to flow the chopped constant-current to a sample for taking the difference in the potential difference of both ends of the sample at the time of conduction and nonconduction of the current. CONSTITUTION:The current is made to flow from the constant current source 2 through a chopper 3 to the sample 1. The potential difference taken out through the lead wire 4 is held by the sample hold circuits 6-1 and 6-2 through the amplifier 5. From the signal held by the SH circuit the portion of DC of the inductive voltage is eliminated by taking the difference through the substraction circuit 8. For avoiding the output of the spike noise of FET of the SH circuit the sampling signal (d) of the AD converter 9 is set so that the phase thereof forwards than the timing signals (b) and (c) to be controlled by the timing logic circuit 12. The output of the AD converter 9 is put out to the recording terminal 11 through the DA converter 10.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1854880A JPS56115960A (en) | 1980-02-19 | 1980-02-19 | Electric resistance measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1854880A JPS56115960A (en) | 1980-02-19 | 1980-02-19 | Electric resistance measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56115960A true JPS56115960A (en) | 1981-09-11 |
Family
ID=11974676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1854880A Pending JPS56115960A (en) | 1980-02-19 | 1980-02-19 | Electric resistance measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56115960A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60185151A (en) * | 1983-11-10 | 1985-09-20 | シ−メンス、アクチエンゲゼルシヤフト | Method of measuring electric resistance of metallic layer |
EP0441649A2 (en) * | 1990-02-08 | 1991-08-14 | Uponor Bv | Inductance and resistance measuring circuit |
WO2005088323A1 (en) * | 2004-03-08 | 2005-09-22 | Siemens Aktiengesellschaft | Method and measurement circuit for measuring an unknown electrical resistance in the presence of an unknown fixed interference voltage or a fixed unknown interference current |
JP2008512872A (en) * | 2004-09-13 | 2008-04-24 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | Analysis method of thermoelectric potential during laser trimming to resistor |
CN103257279A (en) * | 2013-04-24 | 2013-08-21 | 兰州空间技术物理研究所 | Device and method for testing medium material radiation induction conductivity for satellite |
-
1980
- 1980-02-19 JP JP1854880A patent/JPS56115960A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60185151A (en) * | 1983-11-10 | 1985-09-20 | シ−メンス、アクチエンゲゼルシヤフト | Method of measuring electric resistance of metallic layer |
EP0441649A2 (en) * | 1990-02-08 | 1991-08-14 | Uponor Bv | Inductance and resistance measuring circuit |
WO2005088323A1 (en) * | 2004-03-08 | 2005-09-22 | Siemens Aktiengesellschaft | Method and measurement circuit for measuring an unknown electrical resistance in the presence of an unknown fixed interference voltage or a fixed unknown interference current |
JP2008512872A (en) * | 2004-09-13 | 2008-04-24 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | Analysis method of thermoelectric potential during laser trimming to resistor |
JP4785854B2 (en) * | 2004-09-13 | 2011-10-05 | エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド | Analysis method of thermoelectric potential during laser trimming to resistor |
CN103257279A (en) * | 2013-04-24 | 2013-08-21 | 兰州空间技术物理研究所 | Device and method for testing medium material radiation induction conductivity for satellite |
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