JPS5739358A - Electric current measuring device - Google Patents

Electric current measuring device

Info

Publication number
JPS5739358A
JPS5739358A JP55114045A JP11404580A JPS5739358A JP S5739358 A JPS5739358 A JP S5739358A JP 55114045 A JP55114045 A JP 55114045A JP 11404580 A JP11404580 A JP 11404580A JP S5739358 A JPS5739358 A JP S5739358A
Authority
JP
Japan
Prior art keywords
resistance
dut
signal wire
measuring device
electric current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55114045A
Other languages
Japanese (ja)
Inventor
Shinichi Hanayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55114045A priority Critical patent/JPS5739358A/en
Publication of JPS5739358A publication Critical patent/JPS5739358A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To reduce the floating capacities between signal wires and reduce stability time by providing a guard line driving circuit which applies voltage to external signal wires and drives the same to a measuring device. CONSTITUTION:The output voltage E of a digital to analog converter D/A applied with input digital signals D1, D2...Dn is applied to a circuit element DUT to be measured by the input resistance R1 and feedback resistance R2 of an operational amplifier A1. The potential difference across the resistance RM is determined by operational amplifiers A2, A3, A4, and is inputted to an analog to digital converter A/D, by which the electric current value (i) flowing to the DUT is measured. On the other hand, the output of a voltage follower A5 connected to the connection point of the resistance RM and the DUT is applied to the outside signal wire 10b of a shielded wire. Thereby, the potential difference between the inner signal wire and the outer signal wire is made zero, and the delay by floating capacities is reduced.
JP55114045A 1980-08-21 1980-08-21 Electric current measuring device Pending JPS5739358A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55114045A JPS5739358A (en) 1980-08-21 1980-08-21 Electric current measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55114045A JPS5739358A (en) 1980-08-21 1980-08-21 Electric current measuring device

Publications (1)

Publication Number Publication Date
JPS5739358A true JPS5739358A (en) 1982-03-04

Family

ID=14627643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55114045A Pending JPS5739358A (en) 1980-08-21 1980-08-21 Electric current measuring device

Country Status (1)

Country Link
JP (1) JPS5739358A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6021906A (en) * 1983-07-14 1985-02-04 Asahi Chem Ind Co Ltd Poly(p-phenylene terephthalamide) fiber and its manufacture
JPS6176U (en) * 1984-06-07 1986-01-06 沖電気工業株式会社 Semiconductor IC device testing equipment
JPS6258774U (en) * 1985-07-31 1987-04-11

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4718576A (en) * 1971-02-11 1972-09-14
JPS5342863A (en) * 1976-09-27 1978-04-18 Siemens Ag Circuit device for measuring current or voltage

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4718576A (en) * 1971-02-11 1972-09-14
JPS5342863A (en) * 1976-09-27 1978-04-18 Siemens Ag Circuit device for measuring current or voltage

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6021906A (en) * 1983-07-14 1985-02-04 Asahi Chem Ind Co Ltd Poly(p-phenylene terephthalamide) fiber and its manufacture
JPS6176U (en) * 1984-06-07 1986-01-06 沖電気工業株式会社 Semiconductor IC device testing equipment
JPS6258774U (en) * 1985-07-31 1987-04-11

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