JPS56111433A - Sampling circuit for analog signal - Google Patents

Sampling circuit for analog signal

Info

Publication number
JPS56111433A
JPS56111433A JP1525580A JP1525580A JPS56111433A JP S56111433 A JPS56111433 A JP S56111433A JP 1525580 A JP1525580 A JP 1525580A JP 1525580 A JP1525580 A JP 1525580A JP S56111433 A JPS56111433 A JP S56111433A
Authority
JP
Japan
Prior art keywords
circuit
trigger
sampling
signal
lpf3
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1525580A
Other languages
Japanese (ja)
Inventor
Junichi Hatayama
Yoshihiro Ono
Tetsuo Matsuba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1525580A priority Critical patent/JPS56111433A/en
Publication of JPS56111433A publication Critical patent/JPS56111433A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE:To enable signal sampling at the moment when a trigger signal is generated, by correcting trigger timing corresponding to the phase delay of an input signal due to passage via low-pass filtering circuit. CONSTITUTION:An analog signal detected by detector 1 has a disused frequency component removed by active LPF3 and is sampled by sample holding circuit 4. A sampling signal applied to this circuit 4 from trigger pulse generating circuit 6 is corrected in terms of time delay by trigger timing correcting circuit 7 corresponding to the phase delay due to LPF3. Therefore, the input signal value at the moment when a sampling pulse is generated is sampled, so that accurate measurements by A/D conversion, etc., can be take.
JP1525580A 1980-02-08 1980-02-08 Sampling circuit for analog signal Pending JPS56111433A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1525580A JPS56111433A (en) 1980-02-08 1980-02-08 Sampling circuit for analog signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1525580A JPS56111433A (en) 1980-02-08 1980-02-08 Sampling circuit for analog signal

Publications (1)

Publication Number Publication Date
JPS56111433A true JPS56111433A (en) 1981-09-03

Family

ID=11883741

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1525580A Pending JPS56111433A (en) 1980-02-08 1980-02-08 Sampling circuit for analog signal

Country Status (1)

Country Link
JP (1) JPS56111433A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5295110A (en) * 1976-02-06 1977-08-10 Anritsu Corp Frequency characteristics measuring apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5295110A (en) * 1976-02-06 1977-08-10 Anritsu Corp Frequency characteristics measuring apparatus

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