JPS56105646A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS56105646A
JPS56105646A JP853580A JP853580A JPS56105646A JP S56105646 A JPS56105646 A JP S56105646A JP 853580 A JP853580 A JP 853580A JP 853580 A JP853580 A JP 853580A JP S56105646 A JPS56105646 A JP S56105646A
Authority
JP
Japan
Prior art keywords
inferior
articles
errors
lead
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP853580A
Other languages
Japanese (ja)
Other versions
JPS6138856B2 (en
Inventor
Manabu Bonshihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP853580A priority Critical patent/JPS56105646A/en
Publication of JPS56105646A publication Critical patent/JPS56105646A/en
Publication of JPS6138856B2 publication Critical patent/JPS6138856B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To prevent counting errors of excellent articles and errors in fitting inferior articles by collectively cutting out leads and lead frame of inferior semiconductor device and by leaving the excellent goods only on a film carrier. CONSTITUTION:A semiconductor element 4 judged inferior is punched with a metal mold at the lead part 2, or allowed to be cut out from a polyamide frame supporting the lead. In such a manner, a production rate of the inferior articles is made clear and accurate by each different process and a special inferiority rate is clarified by changing a shape of cutting dies. Further, there can not occur the counting errors of excellent articles and errors of cutting down and using the inferior goods.
JP853580A 1980-01-28 1980-01-28 Manufacture of semiconductor device Granted JPS56105646A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP853580A JPS56105646A (en) 1980-01-28 1980-01-28 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP853580A JPS56105646A (en) 1980-01-28 1980-01-28 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS56105646A true JPS56105646A (en) 1981-08-22
JPS6138856B2 JPS6138856B2 (en) 1986-09-01

Family

ID=11695836

Family Applications (1)

Application Number Title Priority Date Filing Date
JP853580A Granted JPS56105646A (en) 1980-01-28 1980-01-28 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS56105646A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57350A (en) * 1980-05-31 1982-01-05 Hino Motors Ltd Exhaust recirculation controller in diese lengine
JPS5944840A (en) * 1982-09-07 1984-03-13 Toshiba Corp Measuring apparatus of flat package
JPS6021456A (en) * 1983-07-15 1985-02-02 Shimadzu Corp Automatic analyzer
US4954453A (en) * 1989-02-24 1990-09-04 At&T Bell Laboratories Method of producing an article comprising a multichip assembly

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57350A (en) * 1980-05-31 1982-01-05 Hino Motors Ltd Exhaust recirculation controller in diese lengine
JPS5944840A (en) * 1982-09-07 1984-03-13 Toshiba Corp Measuring apparatus of flat package
JPS6021456A (en) * 1983-07-15 1985-02-02 Shimadzu Corp Automatic analyzer
US4954453A (en) * 1989-02-24 1990-09-04 At&T Bell Laboratories Method of producing an article comprising a multichip assembly

Also Published As

Publication number Publication date
JPS6138856B2 (en) 1986-09-01

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