JPS5598354A - Sample holding plate for ultrasonic wave microscope - Google Patents
Sample holding plate for ultrasonic wave microscopeInfo
- Publication number
- JPS5598354A JPS5598354A JP625079A JP625079A JPS5598354A JP S5598354 A JPS5598354 A JP S5598354A JP 625079 A JP625079 A JP 625079A JP 625079 A JP625079 A JP 625079A JP S5598354 A JPS5598354 A JP S5598354A
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic wave
- holding plate
- sample holding
- wave beam
- sapphire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 239000000463 material Substances 0.000 abstract 2
- 229910052594 sapphire Inorganic materials 0.000 abstract 2
- 239000010980 sapphire Substances 0.000 abstract 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP625079A JPS5598354A (en) | 1979-01-22 | 1979-01-22 | Sample holding plate for ultrasonic wave microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP625079A JPS5598354A (en) | 1979-01-22 | 1979-01-22 | Sample holding plate for ultrasonic wave microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5598354A true JPS5598354A (en) | 1980-07-26 |
JPS6152426B2 JPS6152426B2 (enrdf_load_stackoverflow) | 1986-11-13 |
Family
ID=11633234
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP625079A Granted JPS5598354A (en) | 1979-01-22 | 1979-01-22 | Sample holding plate for ultrasonic wave microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5598354A (enrdf_load_stackoverflow) |
-
1979
- 1979-01-22 JP JP625079A patent/JPS5598354A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6152426B2 (enrdf_load_stackoverflow) | 1986-11-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Torres et al. | Sonic band gaps in finite elastic media: surface states and localization phenomena in linear and point defects | |
FR2603423A1 (fr) | Convertisseur d'ondes acoustiques de surface | |
CA2105258A1 (en) | Piezoelectric Semiconductor and Process for Production Thereof | |
JPS5675686A (en) | Ultrasonic video device | |
JPS5693415A (en) | Elastic surface wave parametric device | |
GB633144A (en) | Improvements in or relating to supersonic inspection apparatus | |
JPS5598354A (en) | Sample holding plate for ultrasonic wave microscope | |
JPS5350884A (en) | Ultrasonic wave probe apparatus | |
US3756345A (en) | Underwater acoustic device | |
SU726655A1 (ru) | Регулируема лини задержки | |
SE8701117D0 (sv) | Ultraljudsinstrument | |
JPS57104856A (en) | Sonic microscope | |
Chubachi et al. | Scanning acoustic microscope employing concave ultrasonic transducers | |
JPS56141700A (en) | Piezo-oscillator | |
JPS5344075A (en) | Ultrasonic inspecting method | |
JPS55121799A (en) | Electroacoustic conversion element | |
JPS52149062A (en) | Scanning electronic microscope | |
JPS53100285A (en) | Ultrasonic probe device | |
Tsukahara et al. | Layer Thickness Measurement of Various Materials Using Pseudo-Sezawa Waves | |
JPS54120352A (en) | High damping material | |
JPS56154899A (en) | Array type ultrasonic probe | |
JPS5746141A (en) | Knife for ultramicrotome formed of alpha-alumina single crystal and manufacture thereof | |
JPS5658659A (en) | Measuring method of grain size of steel material using pulse laser light | |
曹东旭 et al. | Detection of thin layer of foreign material in plates by ultrasonic frequency spectrum | |
JPS5399989A (en) | Contactless type ultrasonic flaw detection method |