JPS5598318A - Correction method of analysis device - Google Patents

Correction method of analysis device

Info

Publication number
JPS5598318A
JPS5598318A JP643579A JP643579A JPS5598318A JP S5598318 A JPS5598318 A JP S5598318A JP 643579 A JP643579 A JP 643579A JP 643579 A JP643579 A JP 643579A JP S5598318 A JPS5598318 A JP S5598318A
Authority
JP
Japan
Prior art keywords
sample
sensitivity
standard sample
analysis device
initial value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP643579A
Other languages
Japanese (ja)
Other versions
JPS6243127B2 (en
Inventor
Masaaki Inoue
Hitoshi Yamada
Seiichiro Kiyobe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Hokushin Electric Corp
Priority to JP643579A priority Critical patent/JPS5598318A/en
Publication of JPS5598318A publication Critical patent/JPS5598318A/en
Publication of JPS6243127B2 publication Critical patent/JPS6243127B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To carry out high precision correction by the use of an easily available element, by obtaining the change in sensitivity from a first sample and a maximum sensitivity wave length from a second sample. CONSTITUTION:A first standard sample having a plain spectroscopic transmission characteristic and a second standard sample having an inclining characteristic are prepared. A first standard sample is charged in an analysis device to be corrected to obtain a maiximum sensitivity SmaxR of the reference light side and a maximum sensitivity SmaxM of the measuring light side. By comparing them with a previously recorded initial value, the change amount DELTASmaxR and DELTASmaxM are obtained and it is compared with the initial value to obtain DELTAlambdamaxM. Thus, from the representative characteristic view, the precisely correct value can be obtained.
JP643579A 1979-01-19 1979-01-19 Correction method of analysis device Granted JPS5598318A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP643579A JPS5598318A (en) 1979-01-19 1979-01-19 Correction method of analysis device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP643579A JPS5598318A (en) 1979-01-19 1979-01-19 Correction method of analysis device

Publications (2)

Publication Number Publication Date
JPS5598318A true JPS5598318A (en) 1980-07-26
JPS6243127B2 JPS6243127B2 (en) 1987-09-11

Family

ID=11638308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP643579A Granted JPS5598318A (en) 1979-01-19 1979-01-19 Correction method of analysis device

Country Status (1)

Country Link
JP (1) JPS5598318A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01176731U (en) * 1988-05-31 1989-12-18

Also Published As

Publication number Publication date
JPS6243127B2 (en) 1987-09-11

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