JPS5590866A - Function testing machine for digital integrated circuit - Google Patents
Function testing machine for digital integrated circuitInfo
- Publication number
- JPS5590866A JPS5590866A JP16506378A JP16506378A JPS5590866A JP S5590866 A JPS5590866 A JP S5590866A JP 16506378 A JP16506378 A JP 16506378A JP 16506378 A JP16506378 A JP 16506378A JP S5590866 A JPS5590866 A JP S5590866A
- Authority
- JP
- Japan
- Prior art keywords
- outputs
- supplied
- pattern
- integrated circuit
- testing machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To carry out complete test by detecting abnormality in comparison of outputs of a standard device or a device to be tested at every time where the output of any of both devices varies.
CONSTITUTION: A test pattern from a pattern generator 1 is supplied to a standard device 4 and a device 5 to be tested. Level comparators 6 and 7 receive the outputs of devices 4 and 5, and the outputs are delivered to a pattern comparator 10. Further, the outputs are supplied through delay circuits 8 and 9 to a pattern comparator 10, and further supplied to one-shot multipliers 11 and 12 to produce strove pulses. The outputs of level comparators 6 and 7 are coincident with each other, if they are normal, and they are not coincident, if they are abnormal. As a result, the output state of a good or bad signal generator 13 is varied.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53165063A JPS5950944B2 (en) | 1978-12-29 | 1978-12-29 | Digital integrated circuit function tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53165063A JPS5950944B2 (en) | 1978-12-29 | 1978-12-29 | Digital integrated circuit function tester |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5590866A true JPS5590866A (en) | 1980-07-09 |
JPS5950944B2 JPS5950944B2 (en) | 1984-12-11 |
Family
ID=15805143
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53165063A Expired JPS5950944B2 (en) | 1978-12-29 | 1978-12-29 | Digital integrated circuit function tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5950944B2 (en) |
-
1978
- 1978-12-29 JP JP53165063A patent/JPS5950944B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5950944B2 (en) | 1984-12-11 |
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