JPS5590847A - Xxray spectroscope - Google Patents
Xxray spectroscopeInfo
- Publication number
- JPS5590847A JPS5590847A JP16359878A JP16359878A JPS5590847A JP S5590847 A JPS5590847 A JP S5590847A JP 16359878 A JP16359878 A JP 16359878A JP 16359878 A JP16359878 A JP 16359878A JP S5590847 A JPS5590847 A JP S5590847A
- Authority
- JP
- Japan
- Prior art keywords
- spectral
- parts
- single crystal
- lolland
- curved single
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16359878A JPS5590847A (en) | 1978-12-29 | 1978-12-29 | Xxray spectroscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16359878A JPS5590847A (en) | 1978-12-29 | 1978-12-29 | Xxray spectroscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5590847A true JPS5590847A (en) | 1980-07-09 |
| JPS6259257B2 JPS6259257B2 (https=) | 1987-12-10 |
Family
ID=15776956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16359878A Granted JPS5590847A (en) | 1978-12-29 | 1978-12-29 | Xxray spectroscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5590847A (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6161456U (https=) * | 1984-09-28 | 1986-04-25 | ||
| US5569919A (en) * | 1994-10-04 | 1996-10-29 | Kabushiki Kaisha Kobe Seiko Sho | X-ray analytical apparatus |
-
1978
- 1978-12-29 JP JP16359878A patent/JPS5590847A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6161456U (https=) * | 1984-09-28 | 1986-04-25 | ||
| US5569919A (en) * | 1994-10-04 | 1996-10-29 | Kabushiki Kaisha Kobe Seiko Sho | X-ray analytical apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6259257B2 (https=) | 1987-12-10 |
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