JPS5590847A - Xxray spectroscope - Google Patents

Xxray spectroscope

Info

Publication number
JPS5590847A
JPS5590847A JP16359878A JP16359878A JPS5590847A JP S5590847 A JPS5590847 A JP S5590847A JP 16359878 A JP16359878 A JP 16359878A JP 16359878 A JP16359878 A JP 16359878A JP S5590847 A JPS5590847 A JP S5590847A
Authority
JP
Japan
Prior art keywords
spectral
parts
single crystal
lolland
curved single
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16359878A
Other languages
Japanese (ja)
Other versions
JPS6259257B2 (en
Inventor
Kazuo Koyanagi
Teruji Hirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP16359878A priority Critical patent/JPS5590847A/en
Publication of JPS5590847A publication Critical patent/JPS5590847A/en
Publication of JPS6259257B2 publication Critical patent/JPS6259257B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To make it possible to cubically condense characteristic X-rays irradiated by dividing the spectral face of a curved single crystal into a plurality parts in the thickness direction perpendicular to the Lolland circle plane, and providing these parts at specific positions corresponding to the specific wavelength to be spectral- diffracted. CONSTITUTION:The spectral face of a curved single crystal is divided into a plurality parts, for example, three parts 7-9 in the thickness direction perpendiculor to the Lolland circle 6 plane. In correspondence to the specific wavelength of characteristic X-rays to be spectral-diffracted, these parts are positioned, in contacting manner, at rotating curvature formed by rotating the condensing curve of the spectral face of the curved single crystal 4 around the axis of a straight line connecting the focal point S and X-ray source P moving on the Lolland circle 6. By this procedure, the spectral face of the curved single crystal which has not been useful for condensation in the conventional device is made usable, and it is possible to obtain an X-ray spectroscope close to the complete condensation type capable of condensing cubic characteristic X-rays.
JP16359878A 1978-12-29 1978-12-29 Xxray spectroscope Granted JPS5590847A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16359878A JPS5590847A (en) 1978-12-29 1978-12-29 Xxray spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16359878A JPS5590847A (en) 1978-12-29 1978-12-29 Xxray spectroscope

Publications (2)

Publication Number Publication Date
JPS5590847A true JPS5590847A (en) 1980-07-09
JPS6259257B2 JPS6259257B2 (en) 1987-12-10

Family

ID=15776956

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16359878A Granted JPS5590847A (en) 1978-12-29 1978-12-29 Xxray spectroscope

Country Status (1)

Country Link
JP (1) JPS5590847A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6161456U (en) * 1984-09-28 1986-04-25
US5569919A (en) * 1994-10-04 1996-10-29 Kabushiki Kaisha Kobe Seiko Sho X-ray analytical apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6161456U (en) * 1984-09-28 1986-04-25
JPH0512762Y2 (en) * 1984-09-28 1993-04-02
US5569919A (en) * 1994-10-04 1996-10-29 Kabushiki Kaisha Kobe Seiko Sho X-ray analytical apparatus

Also Published As

Publication number Publication date
JPS6259257B2 (en) 1987-12-10

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