JPS5588329A - Exposing method for electron beam - Google Patents

Exposing method for electron beam

Info

Publication number
JPS5588329A
JPS5588329A JP16245278A JP16245278A JPS5588329A JP S5588329 A JPS5588329 A JP S5588329A JP 16245278 A JP16245278 A JP 16245278A JP 16245278 A JP16245278 A JP 16245278A JP S5588329 A JPS5588329 A JP S5588329A
Authority
JP
Japan
Prior art keywords
electron beam
rectangular
scanning
shape
latticelike
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16245278A
Other languages
English (en)
Other versions
JPS6138851B2 (ja
Inventor
Junichi Kai
Nobuyuki Yasutake
Toru Funayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIYOU LSI GIJUTSU KENKYU KUMIAI
CHO LSI GIJUTSU KENKYU KUMIAI
Original Assignee
CHIYOU LSI GIJUTSU KENKYU KUMIAI
CHO LSI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIYOU LSI GIJUTSU KENKYU KUMIAI, CHO LSI GIJUTSU KENKYU KUMIAI filed Critical CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority to JP16245278A priority Critical patent/JPS5588329A/ja
Publication of JPS5588329A publication Critical patent/JPS5588329A/ja
Publication of JPS6138851B2 publication Critical patent/JPS6138851B2/ja
Granted legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3174Particle-beam lithography, e.g. electron beam lithography

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Analytical Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Beam Exposure (AREA)
JP16245278A 1978-12-27 1978-12-27 Exposing method for electron beam Granted JPS5588329A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16245278A JPS5588329A (en) 1978-12-27 1978-12-27 Exposing method for electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16245278A JPS5588329A (en) 1978-12-27 1978-12-27 Exposing method for electron beam

Publications (2)

Publication Number Publication Date
JPS5588329A true JPS5588329A (en) 1980-07-04
JPS6138851B2 JPS6138851B2 (ja) 1986-09-01

Family

ID=15754872

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16245278A Granted JPS5588329A (en) 1978-12-27 1978-12-27 Exposing method for electron beam

Country Status (1)

Country Link
JP (1) JPS5588329A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766637A (en) * 1980-10-14 1982-04-22 Toshiba Corp Exposure device for electron beam

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004264476A (ja) * 2003-02-28 2004-09-24 Sharp Corp 表示装置およびその駆動方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766637A (en) * 1980-10-14 1982-04-22 Toshiba Corp Exposure device for electron beam

Also Published As

Publication number Publication date
JPS6138851B2 (ja) 1986-09-01

Similar Documents

Publication Publication Date Title
WO1994023458A3 (en) X-ray detector for a low dosage scanning beam digital x-ray imaging system
US4942333A (en) Shadow mask with border pattern
JPS5588329A (en) Exposing method for electron beam
DE3778422D1 (de) Elektronenstrahlerzeugungssystem.
GB701543A (en) Television image projector
ES8106816A1 (es) Un aparato mejorado para formar un trazado de haces de elec-trones por exploracion
JPS5621057A (en) Electron scanning type supersonic wave probe
JPS5679845A (en) Picture display device
ES8702724A1 (es) Recinto para clasificar materiales de radioactividad relati-vamente reducida
EP0309948A3 (en) Lenslet array and method for providing apertures on lenslet arrays
JPS5619056A (en) Method and apparatus for scanning and recording printed dot image
JPS6480896A (en) Instrument for measuring two-dimensional distribution of radiation
JPS5240146A (en) Device for scanning beams of light
JPS546767A (en) Manufacture of semiconductor device
JPS5794713A (en) Image forming device
JPS51142220A (en) Picture receiving device
JPS54131992A (en) Scanning type electron microscope
JPS57206029A (en) Drawing device by electron beam
JPS55111130A (en) Electron beam scanning system
JPS5534588A (en) Circular arc type array antenna
JPS5640244A (en) Beam scanning correction at electron beam exposure
JPS5353975A (en) Electronic beam exposure device
JPS5326193A (en) Observing method of ion beam radiati on point positions
JPS6457200A (en) Transforming panel of radiation image
JPS5643780A (en) Photosensor panel