JPS5583838A - Scattered light measuring unit of multi-layer dielectric film - Google Patents
Scattered light measuring unit of multi-layer dielectric filmInfo
- Publication number
- JPS5583838A JPS5583838A JP15952078A JP15952078A JPS5583838A JP S5583838 A JPS5583838 A JP S5583838A JP 15952078 A JP15952078 A JP 15952078A JP 15952078 A JP15952078 A JP 15952078A JP S5583838 A JPS5583838 A JP S5583838A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric film
- layer dielectric
- light
- receiving element
- light receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To decide whether a multi-layer dielectric film is good or not easily and cheaply by arranging the photosensitive face of a light receiving element oppositely to the multi-layer dielectric film face and providing a hole, where the light from a light source and the reflection light from the multi-layer dielectric film face pass, in the light receiving element. CONSTITUTION:A solar battery is used as light receiving element 7, and light receiving element 7 is so arranged that the photosensitive face may be opposite to multi-layer dielectric film 10, and hole 8 where the laser light from the He-Ne laser tube of a light source and the reflection light from multi-layer dielectric film 10 pass is provided in light receiving element 7, and this measuring system is stored in dark box 14. A scattered light quantity, namely, the output voltage of the light receiving element measured by this unit is proportional to the laser output obtained by arranging the multi-layer dielectric film in the laser tube. Thus, it can be decided whether the multi-layer dielectric film is good or not cheaply with a high work efficiency.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15952078A JPS5583838A (en) | 1978-12-21 | 1978-12-21 | Scattered light measuring unit of multi-layer dielectric film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15952078A JPS5583838A (en) | 1978-12-21 | 1978-12-21 | Scattered light measuring unit of multi-layer dielectric film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5583838A true JPS5583838A (en) | 1980-06-24 |
Family
ID=15695556
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15952078A Pending JPS5583838A (en) | 1978-12-21 | 1978-12-21 | Scattered light measuring unit of multi-layer dielectric film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5583838A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59151141U (en) * | 1983-03-29 | 1984-10-09 | 日本電子株式会社 | Sample pan in a spectrophotometer |
-
1978
- 1978-12-21 JP JP15952078A patent/JPS5583838A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59151141U (en) * | 1983-03-29 | 1984-10-09 | 日本電子株式会社 | Sample pan in a spectrophotometer |
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