JPS557656B2 - - Google Patents

Info

Publication number
JPS557656B2
JPS557656B2 JP7148972A JP7148972A JPS557656B2 JP S557656 B2 JPS557656 B2 JP S557656B2 JP 7148972 A JP7148972 A JP 7148972A JP 7148972 A JP7148972 A JP 7148972A JP S557656 B2 JPS557656 B2 JP S557656B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7148972A
Other languages
Japanese (ja)
Other versions
JPS4929766A (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7148972A priority Critical patent/JPS557656B2/ja
Priority to GB3291873A priority patent/GB1431069A/en
Priority to US377932A priority patent/US3887839A/en
Priority to FR7326053A priority patent/FR2193248B1/fr
Priority to DE19732336155 priority patent/DE2336155C3/de
Publication of JPS4929766A publication Critical patent/JPS4929766A/ja
Publication of JPS557656B2 publication Critical patent/JPS557656B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/02—Electron guns
    • H01J3/021—Electron guns using a field emission, photo emission, or secondary emission electron source

Landscapes

  • Electron Sources, Ion Sources (AREA)
  • Cold Cathode And The Manufacture (AREA)
JP7148972A 1972-07-17 1972-07-17 Expired JPS557656B2 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP7148972A JPS557656B2 (ko) 1972-07-17 1972-07-17
GB3291873A GB1431069A (en) 1972-07-17 1973-07-10 Pulsed field emission electron gun apparatus
US377932A US3887839A (en) 1972-07-17 1973-07-10 Pulsed field emission type electron gun
FR7326053A FR2193248B1 (ko) 1972-07-17 1973-07-16
DE19732336155 DE2336155C3 (de) 1972-07-17 1973-07-16 Verfahren zum Betrieb einer FeIdemmissioiiselektronenquelle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7148972A JPS557656B2 (ko) 1972-07-17 1972-07-17

Publications (2)

Publication Number Publication Date
JPS4929766A JPS4929766A (ko) 1974-03-16
JPS557656B2 true JPS557656B2 (ko) 1980-02-27

Family

ID=13462110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7148972A Expired JPS557656B2 (ko) 1972-07-17 1972-07-17

Country Status (4)

Country Link
US (1) US3887839A (ko)
JP (1) JPS557656B2 (ko)
FR (1) FR2193248B1 (ko)
GB (1) GB1431069A (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5818101A (ja) * 1981-07-27 1983-02-02 Nippon Denzai Kogyo Kenkyusho:Kk タツチセンサ−
JPS6440219A (en) * 1987-08-04 1989-02-10 Fanuc Ltd Machining start hole measuring device

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4337422A (en) * 1980-03-17 1982-06-29 The Perkin-Elmer Corporation Field emission gun with noise compensation
US5025196A (en) * 1986-06-02 1991-06-18 Canon Kabushiki Kaisha Image forming device with beam current control
JP3131339B2 (ja) * 1993-12-22 2001-01-31 三菱電機株式会社 陰極、陰極線管および陰極線管の作動方法
JPH08212952A (ja) * 1995-02-06 1996-08-20 Natl Res Inst For Metals レーザー照射型電子銃
EP1426997A1 (en) * 2002-12-06 2004-06-09 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh Field emitter beam source and method for controlling a beam current
EP1760761B1 (en) * 2005-09-05 2017-10-18 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam emitting device and method for operating a charged particle beam emitting device
EP2365511B1 (en) 2010-03-10 2013-05-08 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Feedback loop for emitter flash cleaning
US8487534B2 (en) * 2010-03-31 2013-07-16 General Electric Company Pierce gun and method of controlling thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE878685C (de) * 1951-03-28 1953-06-05 Wilhelm Dipl-Chem Dr Stuermer Verfahren zur Abbildung von Objekten mit dem Feldemissionsmikroskop
US3361928A (en) * 1962-11-28 1968-01-02 Hitachi Ltd Transformers having a plurality of secondary windings and charged particle sources of double pulsing system utilizing such transformers
US3775637A (en) * 1971-09-15 1973-11-27 Rca Corp Cathode ray display intensity control circuit
US3786305A (en) * 1972-05-15 1974-01-15 Hitachi Ltd Field emission electron gun
US3794878A (en) * 1972-12-11 1974-02-26 Ford Motor Co Electron beam regulator

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5818101A (ja) * 1981-07-27 1983-02-02 Nippon Denzai Kogyo Kenkyusho:Kk タツチセンサ−
JPS6440219A (en) * 1987-08-04 1989-02-10 Fanuc Ltd Machining start hole measuring device

Also Published As

Publication number Publication date
JPS4929766A (ko) 1974-03-16
FR2193248B1 (ko) 1977-02-18
GB1431069A (en) 1976-04-07
DE2336155A1 (de) 1974-02-07
DE2336155B2 (de) 1975-10-16
US3887839A (en) 1975-06-03
FR2193248A1 (ko) 1974-02-15

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