JPS556280A - Warp selecting and testing method of substrate - Google Patents

Warp selecting and testing method of substrate

Info

Publication number
JPS556280A
JPS556280A JP7953778A JP7953778A JPS556280A JP S556280 A JPS556280 A JP S556280A JP 7953778 A JP7953778 A JP 7953778A JP 7953778 A JP7953778 A JP 7953778A JP S556280 A JPS556280 A JP S556280A
Authority
JP
Japan
Prior art keywords
substrate
warp
testing method
distance
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7953778A
Other languages
Japanese (ja)
Inventor
Takao Mizonobe
Toshihiro Ishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7953778A priority Critical patent/JPS556280A/en
Publication of JPS556280A publication Critical patent/JPS556280A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE: To detect the warp of a substrate by dropping a test substrate, which is either placed on a flat table inclined at a preset angle or held at a level from and in parallel with the table, along the table and by measuring the dropping distance.
CONSTITUTION: The flat table T having a length L is inclined at a preset angle θ, and a test substrate S is held at a preset level H from and in parallel with the table T. After that, the substrate S is dropped down onto the table T. And, the distance l the substrate S slides down is measured so that the extent of the warp of the substrate S can be determined from the distance l in view of the chart.
COPYRIGHT: (C)1980,JPO&Japio
JP7953778A 1978-06-29 1978-06-29 Warp selecting and testing method of substrate Pending JPS556280A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7953778A JPS556280A (en) 1978-06-29 1978-06-29 Warp selecting and testing method of substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7953778A JPS556280A (en) 1978-06-29 1978-06-29 Warp selecting and testing method of substrate

Publications (1)

Publication Number Publication Date
JPS556280A true JPS556280A (en) 1980-01-17

Family

ID=13692734

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7953778A Pending JPS556280A (en) 1978-06-29 1978-06-29 Warp selecting and testing method of substrate

Country Status (1)

Country Link
JP (1) JPS556280A (en)

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