JPS5559302A - Freezing thickness detector - Google Patents
Freezing thickness detectorInfo
- Publication number
- JPS5559302A JPS5559302A JP13270478A JP13270478A JPS5559302A JP S5559302 A JPS5559302 A JP S5559302A JP 13270478 A JP13270478 A JP 13270478A JP 13270478 A JP13270478 A JP 13270478A JP S5559302 A JPS5559302 A JP S5559302A
- Authority
- JP
- Japan
- Prior art keywords
- freezing
- electrode
- temperature
- tube
- touch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
PURPOSE: To ensure an accurate measurement for the freezing thickness by securing such electrode structure that the temperature of the freezing detection electrode may follow the temperature of cooled water flowing in touch with the freezing surface of the cooling tube.
CONSTITUTION: Freezing detection electrode 5 of the electrod bar is made to oppose to cooling tube 1 and located along the radius direction of the tube. When cooled water 3 flows in touch with the surface of tube, freezing layer 2 grows gradually to reach electrode 5. In this case, the shift of the heat is cut off for electrode 5 from the supporter or the like owing to existence of heat cut-off electric conduction part 8, and thus the temperature of the electrode follows the temperature of the cooled water flowing in touch with the freezing surface of tube 1. However, the electrode is buried into the freezing surface as the surface grows, and as a result the electrode surface is covered by the ice layer. Accordingly, the current flowing through water 3 is cut off by layer 2, thus ensuring the correct detection for the set position of electrode 5. In this way, the freezing thickness can be measured accurately, at the same time securing the optimum state for the freezing thickness.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13270478A JPS5559302A (en) | 1978-10-30 | 1978-10-30 | Freezing thickness detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13270478A JPS5559302A (en) | 1978-10-30 | 1978-10-30 | Freezing thickness detector |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5559302A true JPS5559302A (en) | 1980-05-02 |
Family
ID=15087599
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13270478A Pending JPS5559302A (en) | 1978-10-30 | 1978-10-30 | Freezing thickness detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5559302A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2806265A4 (en) * | 2012-01-17 | 2015-12-23 | Tex E G Co Ltd | Freezing detection device |
CN106289038A (en) * | 2016-09-19 | 2017-01-04 | 柳玉翠 | Ice maker ice thickness testing circuit and detection method |
CN109141210A (en) * | 2018-09-27 | 2019-01-04 | 山东大学 | A kind of semiconductor pressure resistance icing detector and working method |
-
1978
- 1978-10-30 JP JP13270478A patent/JPS5559302A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2806265A4 (en) * | 2012-01-17 | 2015-12-23 | Tex E G Co Ltd | Freezing detection device |
US9897367B2 (en) | 2012-01-17 | 2018-02-20 | Tex E.G. Co., Ltd. | Freezing detection device |
CN106289038A (en) * | 2016-09-19 | 2017-01-04 | 柳玉翠 | Ice maker ice thickness testing circuit and detection method |
CN109141210A (en) * | 2018-09-27 | 2019-01-04 | 山东大学 | A kind of semiconductor pressure resistance icing detector and working method |
CN109141210B (en) * | 2018-09-27 | 2019-10-15 | 山东大学 | A kind of semiconductor pressure resistance icing detector and working method |
WO2020063491A1 (en) * | 2018-09-27 | 2020-04-02 | 山东大学 | Semiconductor piezoresistive icing detector and working method |
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