JPS5543450A - Automatic x-ray spectroscopic analysis device - Google Patents

Automatic x-ray spectroscopic analysis device

Info

Publication number
JPS5543450A
JPS5543450A JP11707778A JP11707778A JPS5543450A JP S5543450 A JPS5543450 A JP S5543450A JP 11707778 A JP11707778 A JP 11707778A JP 11707778 A JP11707778 A JP 11707778A JP S5543450 A JPS5543450 A JP S5543450A
Authority
JP
Japan
Prior art keywords
ray
data
peak
characteristic
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11707778A
Other languages
English (en)
Japanese (ja)
Other versions
JPS631534B2 (enExample
Inventor
Hiromi Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP11707778A priority Critical patent/JPS5543450A/ja
Publication of JPS5543450A publication Critical patent/JPS5543450A/ja
Publication of JPS631534B2 publication Critical patent/JPS631534B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP11707778A 1978-09-22 1978-09-22 Automatic x-ray spectroscopic analysis device Granted JPS5543450A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11707778A JPS5543450A (en) 1978-09-22 1978-09-22 Automatic x-ray spectroscopic analysis device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11707778A JPS5543450A (en) 1978-09-22 1978-09-22 Automatic x-ray spectroscopic analysis device

Publications (2)

Publication Number Publication Date
JPS5543450A true JPS5543450A (en) 1980-03-27
JPS631534B2 JPS631534B2 (enExample) 1988-01-13

Family

ID=14702823

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11707778A Granted JPS5543450A (en) 1978-09-22 1978-09-22 Automatic x-ray spectroscopic analysis device

Country Status (1)

Country Link
JP (1) JPS5543450A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62165144A (ja) * 1986-01-16 1987-07-21 Jeol Ltd Ｘ線マイクロアナライザの波長表検索方法
JPS6445047A (en) * 1987-08-14 1989-02-17 Nippon Telegraph & Telephone Measuring device for cathode luminesence

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62165144A (ja) * 1986-01-16 1987-07-21 Jeol Ltd Ｘ線マイクロアナライザの波長表検索方法
JPS6445047A (en) * 1987-08-14 1989-02-17 Nippon Telegraph & Telephone Measuring device for cathode luminesence

Also Published As

Publication number Publication date
JPS631534B2 (enExample) 1988-01-13

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