JPS552990A - Method and device for measuring focal length of electronic lens of long focus - Google Patents

Method and device for measuring focal length of electronic lens of long focus

Info

Publication number
JPS552990A
JPS552990A JP7512379A JP7512379A JPS552990A JP S552990 A JPS552990 A JP S552990A JP 7512379 A JP7512379 A JP 7512379A JP 7512379 A JP7512379 A JP 7512379A JP S552990 A JPS552990 A JP S552990A
Authority
JP
Japan
Prior art keywords
focal length
long focus
electronic lens
measuring focal
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7512379A
Other languages
English (en)
Inventor
Angaa Kurausu
Furoojien Yurugen
Rishiyuke Burukuharuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of JPS552990A publication Critical patent/JPS552990A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/21Means for adjusting the focus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002Details
    • H01J37/3007Electron or ion-optical systems
JP7512379A 1978-06-16 1979-06-14 Method and device for measuring focal length of electronic lens of long focus Pending JPS552990A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2827085A DE2827085C2 (de) 1978-06-16 1978-06-16 Verfahren und Vorrichtung zur Brennweitenbestimmung langbrennweitiger elektronenoptischer Linsen

Publications (1)

Publication Number Publication Date
JPS552990A true JPS552990A (en) 1980-01-10

Family

ID=6042288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7512379A Pending JPS552990A (en) 1978-06-16 1979-06-14 Method and device for measuring focal length of electronic lens of long focus

Country Status (4)

Country Link
US (1) US4246487A (ja)
EP (1) EP0006985B1 (ja)
JP (1) JPS552990A (ja)
DE (1) DE2827085C2 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT393925B (de) * 1987-06-02 1992-01-10 Ims Ionen Mikrofab Syst Anordnung zur durchfuehrung eines verfahrens zum positionieren der abbildung der auf einer maske befindlichen struktur auf ein substrat, und verfahren zum ausrichten von auf einer maske angeordneten markierungen auf markierungen, die auf einem traeger angeordnet sind
NL8702570A (nl) * 1987-10-29 1989-05-16 Philips Nv Geladen deeltjes bundel apparaat.
DE3825103A1 (de) * 1988-07-23 1990-01-25 Zeiss Carl Fa Verfahren zum beleuchten eines objektes in einem transmissions-elektronenmikroskop
JPH06215714A (ja) * 1992-06-05 1994-08-05 Hitachi Ltd 電界放出型透過電子顕微鏡
US6215587B1 (en) * 1994-02-14 2001-04-10 Robert R. Alfano Microscope imaging inside highly scattering media
US6441384B1 (en) * 1998-04-08 2002-08-27 Nikon Corporation Charged particle beam exposure device exhibiting reduced image blur

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2213208C3 (de) * 1972-03-16 1975-11-13 Max Planck Gesellschaft Rotationssymetrisches, sphärisch korrigiertes korpuskularstrahloptisches Abbildungssystem
DE2515549C2 (de) * 1975-04-09 1977-04-14 Siemens Ag Korpuskularstrahloptisches geraet zur abbildung einer maske auf ein zu bestrahlendes praeparat
DE2515550C2 (de) * 1975-04-09 1977-05-18 Siemens Ag Korpuskularstrahloptisches geraet zur abbildung einer maske auf ein zu bestrahlendes praeparat

Also Published As

Publication number Publication date
US4246487A (en) 1981-01-20
EP0006985A1 (de) 1980-01-23
EP0006985B1 (de) 1981-08-26
DE2827085B1 (de) 1979-11-08
DE2827085C2 (de) 1980-07-24

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