JPS552918A - Device to detect negative-resistance waveform of semiconductor element - Google Patents

Device to detect negative-resistance waveform of semiconductor element

Info

Publication number
JPS552918A
JPS552918A JP7537478A JP7537478A JPS552918A JP S552918 A JPS552918 A JP S552918A JP 7537478 A JP7537478 A JP 7537478A JP 7537478 A JP7537478 A JP 7537478A JP S552918 A JPS552918 A JP S552918A
Authority
JP
Japan
Prior art keywords
waveform
semiconductor element
sampling
transistor
values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7537478A
Other languages
Japanese (ja)
Other versions
JPS5717264B2 (en
Inventor
Kazuo Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7537478A priority Critical patent/JPS552918A/en
Publication of JPS552918A publication Critical patent/JPS552918A/en
Publication of JPS5717264B2 publication Critical patent/JPS5717264B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To check whether or not a semiconductor element is defective having negative resistance characteristics by extracting a part of a waveform that could be sampling without sampling a part of a waveform containing high-frequency components.
CONSTITUTION: Voltage V and current I of transistor 3 to be checked, which is impressed with a bias by sweep source 1, are detected and they are sampled by sample hold circuits 12a and 12b via amplifiers 5 and 6. Further, they are converted into digital data by A/D converters 13a and 13b. A/D conversted values are input to memory 15 and stored as the characteristic waveform of the transistor. By memory read circuit 15, they are read out for each cocordinate showing each voltage value. Discriminator 17 counts the number of coordinates having two or more values "0" or "1" and determines whether or not the number of such coordinates exceeds the preset reference number.
COPYRIGHT: (C)1980,JPO&Japio
JP7537478A 1978-06-23 1978-06-23 Device to detect negative-resistance waveform of semiconductor element Granted JPS552918A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7537478A JPS552918A (en) 1978-06-23 1978-06-23 Device to detect negative-resistance waveform of semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7537478A JPS552918A (en) 1978-06-23 1978-06-23 Device to detect negative-resistance waveform of semiconductor element

Publications (2)

Publication Number Publication Date
JPS552918A true JPS552918A (en) 1980-01-10
JPS5717264B2 JPS5717264B2 (en) 1982-04-09

Family

ID=13574358

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7537478A Granted JPS552918A (en) 1978-06-23 1978-06-23 Device to detect negative-resistance waveform of semiconductor element

Country Status (1)

Country Link
JP (1) JPS552918A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005052610A1 (en) * 2003-11-04 2005-06-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Switch device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005052610A1 (en) * 2003-11-04 2005-06-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Switch device
US7327157B2 (en) 2003-11-04 2008-02-05 Fraunhofer-Gesellschaft Zur Angewandten Forschung E.V. Switch device

Also Published As

Publication number Publication date
JPS5717264B2 (en) 1982-04-09

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