JPS5588350A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5588350A
JPS5588350A JP15987078A JP15987078A JPS5588350A JP S5588350 A JPS5588350 A JP S5588350A JP 15987078 A JP15987078 A JP 15987078A JP 15987078 A JP15987078 A JP 15987078A JP S5588350 A JPS5588350 A JP S5588350A
Authority
JP
Japan
Prior art keywords
grade
semiconductor device
decided
supported
sorting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15987078A
Other languages
Japanese (ja)
Inventor
Masuzo Ikumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP15987078A priority Critical patent/JPS5588350A/en
Publication of JPS5588350A publication Critical patent/JPS5588350A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To facilitate an automation of grade sorting work by a method werein each electrical characteristic is measured with a plural semiconductor device supported in parallel on a lead frame or a carrier tape, and a decided grade is stored in the neighborhood of each device.
CONSTITUTION: A grade is decided by measuring electrical characteristic of each device with a plural semiconductor device 10 supported in parallel on a lead frame 11 or a carrier tape, and a storrage hole 15 is perforated in the frame in the neighborhood of each device 10 according to the grade decided as above. After that, when the semiconductor device 10 is separated from a support piece 12, information on position of the grade stored hole 15 is read to grade sorting. According to this method, a plural semiconductor device is supported integrally immediately before the sorting, therefore handling or particular automation can be facilitated. For grade storing method, that of stamping or printing line, figure, symbol, etc. can be used.
COPYRIGHT: (C)1980,JPO&Japio
JP15987078A 1978-12-27 1978-12-27 Manufacture of semiconductor device Pending JPS5588350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15987078A JPS5588350A (en) 1978-12-27 1978-12-27 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15987078A JPS5588350A (en) 1978-12-27 1978-12-27 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5588350A true JPS5588350A (en) 1980-07-04

Family

ID=15703002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15987078A Pending JPS5588350A (en) 1978-12-27 1978-12-27 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5588350A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62203476U (en) * 1986-06-16 1987-12-25
US4859632A (en) * 1987-12-28 1989-08-22 Siemens Corporate Research And Support, Inc. Method for manufacturing the same
JPH0529427A (en) * 1991-07-24 1993-02-05 Nec Corp Manufacture of semiconductor device
JPH0523155U (en) * 1991-09-06 1993-03-26 安藤電気株式会社 TAB tester that grades according to test results
JPH05152388A (en) * 1991-11-28 1993-06-18 Sharp Corp Test device of semiconductor integrated circuit device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62203476U (en) * 1986-06-16 1987-12-25
US4859632A (en) * 1987-12-28 1989-08-22 Siemens Corporate Research And Support, Inc. Method for manufacturing the same
JPH0529427A (en) * 1991-07-24 1993-02-05 Nec Corp Manufacture of semiconductor device
JPH0523155U (en) * 1991-09-06 1993-03-26 安藤電気株式会社 TAB tester that grades according to test results
JPH05152388A (en) * 1991-11-28 1993-06-18 Sharp Corp Test device of semiconductor integrated circuit device

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