JPS5588350A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5588350A JPS5588350A JP15987078A JP15987078A JPS5588350A JP S5588350 A JPS5588350 A JP S5588350A JP 15987078 A JP15987078 A JP 15987078A JP 15987078 A JP15987078 A JP 15987078A JP S5588350 A JPS5588350 A JP S5588350A
- Authority
- JP
- Japan
- Prior art keywords
- grade
- semiconductor device
- decided
- supported
- sorting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To facilitate an automation of grade sorting work by a method werein each electrical characteristic is measured with a plural semiconductor device supported in parallel on a lead frame or a carrier tape, and a decided grade is stored in the neighborhood of each device.
CONSTITUTION: A grade is decided by measuring electrical characteristic of each device with a plural semiconductor device 10 supported in parallel on a lead frame 11 or a carrier tape, and a storrage hole 15 is perforated in the frame in the neighborhood of each device 10 according to the grade decided as above. After that, when the semiconductor device 10 is separated from a support piece 12, information on position of the grade stored hole 15 is read to grade sorting. According to this method, a plural semiconductor device is supported integrally immediately before the sorting, therefore handling or particular automation can be facilitated. For grade storing method, that of stamping or printing line, figure, symbol, etc. can be used.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15987078A JPS5588350A (en) | 1978-12-27 | 1978-12-27 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15987078A JPS5588350A (en) | 1978-12-27 | 1978-12-27 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5588350A true JPS5588350A (en) | 1980-07-04 |
Family
ID=15703002
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15987078A Pending JPS5588350A (en) | 1978-12-27 | 1978-12-27 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5588350A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62203476U (en) * | 1986-06-16 | 1987-12-25 | ||
US4859632A (en) * | 1987-12-28 | 1989-08-22 | Siemens Corporate Research And Support, Inc. | Method for manufacturing the same |
JPH0529427A (en) * | 1991-07-24 | 1993-02-05 | Nec Corp | Manufacture of semiconductor device |
JPH0523155U (en) * | 1991-09-06 | 1993-03-26 | 安藤電気株式会社 | TAB tester that grades according to test results |
JPH05152388A (en) * | 1991-11-28 | 1993-06-18 | Sharp Corp | Test device of semiconductor integrated circuit device |
-
1978
- 1978-12-27 JP JP15987078A patent/JPS5588350A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62203476U (en) * | 1986-06-16 | 1987-12-25 | ||
US4859632A (en) * | 1987-12-28 | 1989-08-22 | Siemens Corporate Research And Support, Inc. | Method for manufacturing the same |
JPH0529427A (en) * | 1991-07-24 | 1993-02-05 | Nec Corp | Manufacture of semiconductor device |
JPH0523155U (en) * | 1991-09-06 | 1993-03-26 | 安藤電気株式会社 | TAB tester that grades according to test results |
JPH05152388A (en) * | 1991-11-28 | 1993-06-18 | Sharp Corp | Test device of semiconductor integrated circuit device |
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