JPS5527931A - Method of measuring load characteristic of high ferquency transistor - Google Patents
Method of measuring load characteristic of high ferquency transistorInfo
- Publication number
- JPS5527931A JPS5527931A JP10073778A JP10073778A JPS5527931A JP S5527931 A JPS5527931 A JP S5527931A JP 10073778 A JP10073778 A JP 10073778A JP 10073778 A JP10073778 A JP 10073778A JP S5527931 A JPS5527931 A JP S5527931A
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- terminal
- impedance
- reflection coefficient
- load characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To seek the scattered matrix of an impedance tuner on the reference of a DC bias dependency of a small signal reflection coefficient estimating a transistor thereby to make it possible to measure the load characteristic of a high frequency transistor of excellent accuracy and reproducibility.
CONSTITUTION: A small signal reflection coefficient estimating a second terminal of a transistor is measured at N-piece DC bias points in a state where the first terminal of a transistor 21 is terminated by an impedance Z1 in high frequency, the first terminal is connected to a signal source 24, the second terminal is connected to an impedance tuner 25 and further connected to a load of a reflection coefficient PL to measure the high-frequency input and output characteristics. Finally, the first terminal of the transistor 21 is terminated by an impedance Z1 22 while the transistor 21 is connected to the impedance tunner 25, and the small signal reflection coefficient estimating the transistor 21 is measured from the outside of the impedance tuner 25.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10073778A JPS5527931A (en) | 1978-08-17 | 1978-08-17 | Method of measuring load characteristic of high ferquency transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10073778A JPS5527931A (en) | 1978-08-17 | 1978-08-17 | Method of measuring load characteristic of high ferquency transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5527931A true JPS5527931A (en) | 1980-02-28 |
JPS612188B2 JPS612188B2 (en) | 1986-01-23 |
Family
ID=14281878
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10073778A Granted JPS5527931A (en) | 1978-08-17 | 1978-08-17 | Method of measuring load characteristic of high ferquency transistor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5527931A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6393884U (en) * | 1986-12-05 | 1988-06-17 |
-
1978
- 1978-08-17 JP JP10073778A patent/JPS5527931A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS612188B2 (en) | 1986-01-23 |
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