JPS5586206A - Designing method for transistor amplifier - Google Patents
Designing method for transistor amplifierInfo
- Publication number
- JPS5586206A JPS5586206A JP16088478A JP16088478A JPS5586206A JP S5586206 A JPS5586206 A JP S5586206A JP 16088478 A JP16088478 A JP 16088478A JP 16088478 A JP16088478 A JP 16088478A JP S5586206 A JPS5586206 A JP S5586206A
- Authority
- JP
- Japan
- Prior art keywords
- parameter
- signal
- amplifier
- frequency
- designed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/60—Amplifiers in which coupling networks have distributed constants, e.g. with waveguide resonators
- H03F3/601—Amplifiers in which coupling networks have distributed constants, e.g. with waveguide resonators using FET's, e.g. GaAs FET's
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
Abstract
PURPOSE:To obtain the effect similar to that when a transistor amplifier is designed by using a large-signal S parameter, by designing it on the basis of a measured small-signal S parameter, a function of a frequency when a transistor is in an unsaturated state. CONSTITUTION:A high-frequency amplifier of FET is designed by calculating characteristics from input reflection coefficient S11 as a function of a frequency, output reflection coefficient S22, input-output transfer coefficient S21, an S parameter of inverse transfer coefficient S12, and the matcher parameter of the amplifier. At this time, an operating bias point selected near point B in an unsaturated state of static characteristics expressed by drain-source voltage VDS and drain-source current IDS to measure the small-signal S parameter for designing. As a result, a high-frequency and high-output amplifier can be designed easily and accurately only by measuring the small-signal S parameter without measuring the complex large-signal S parameter.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16088478A JPS5586206A (en) | 1978-12-25 | 1978-12-25 | Designing method for transistor amplifier |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16088478A JPS5586206A (en) | 1978-12-25 | 1978-12-25 | Designing method for transistor amplifier |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5586206A true JPS5586206A (en) | 1980-06-28 |
JPS6252962B2 JPS6252962B2 (en) | 1987-11-09 |
Family
ID=15724443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16088478A Granted JPS5586206A (en) | 1978-12-25 | 1978-12-25 | Designing method for transistor amplifier |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5586206A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02222587A (en) * | 1989-02-23 | 1990-09-05 | Ricoh Co Ltd | Manufacture of mask semiconductor laser |
-
1978
- 1978-12-25 JP JP16088478A patent/JPS5586206A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6252962B2 (en) | 1987-11-09 |
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