JPS5522106A - Defective portion detection of stabilized metal layer of stabilized superconductive wire - Google Patents

Defective portion detection of stabilized metal layer of stabilized superconductive wire

Info

Publication number
JPS5522106A
JPS5522106A JP9434178A JP9434178A JPS5522106A JP S5522106 A JPS5522106 A JP S5522106A JP 9434178 A JP9434178 A JP 9434178A JP 9434178 A JP9434178 A JP 9434178A JP S5522106 A JPS5522106 A JP S5522106A
Authority
JP
Japan
Prior art keywords
section
stabilized
defective portion
superconductive wire
denoted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9434178A
Other languages
Japanese (ja)
Inventor
Takuya Suzuki
Itaru Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP9434178A priority Critical patent/JPS5522106A/en
Publication of JPS5522106A publication Critical patent/JPS5522106A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To detect a defective portion continuously in a non-conductive manner during a producing process by measuring the variation in the current flowing through a preset longitudinal section and in the voltage between the desired two points in that section.
CONSTITUTION: The specific resistance of a superconductive element constituting a stabilized superconductive wire and a stabilizing metal are denoted at ρS and ρN; the areas of a section normal to the longitudinal direction of the superconductive wire are denoted at SS and SN; ρS/ρN=A, SN/SS=γ; the electric resistance of the super conductive wire per length l is denoted at R; and the value of the resistance R when the value γ is infinite (which means that only the stabilizing metal is used for SS=0). Then, a relationship of R=[A(1+γ)R0]/(1+γA). If there is any fluctuation in the stabilizing metal ratio γ, the electric resistance for that section is varied. As a result, the defective portion of the metal layer can be detected by measuring the electric resistance of a preset section of the stabilizing superconductive wire by a constant current or voltage method. Thus, even during the production, the detective portion can be detected continuously in a not-destructive manner.
COPYRIGHT: (C)1980,JPO&Japio
JP9434178A 1978-08-02 1978-08-02 Defective portion detection of stabilized metal layer of stabilized superconductive wire Pending JPS5522106A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9434178A JPS5522106A (en) 1978-08-02 1978-08-02 Defective portion detection of stabilized metal layer of stabilized superconductive wire

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9434178A JPS5522106A (en) 1978-08-02 1978-08-02 Defective portion detection of stabilized metal layer of stabilized superconductive wire

Publications (1)

Publication Number Publication Date
JPS5522106A true JPS5522106A (en) 1980-02-16

Family

ID=14107581

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9434178A Pending JPS5522106A (en) 1978-08-02 1978-08-02 Defective portion detection of stabilized metal layer of stabilized superconductive wire

Country Status (1)

Country Link
JP (1) JPS5522106A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016027823A1 (en) * 2014-08-20 2016-02-25 住友電装株式会社 Coil manufacturing method and coil manufacturing apparatus
WO2018026367A1 (en) * 2016-08-03 2018-02-08 Hewlett-Packard Development Company, L.P. Conductive wire disposed in a layer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016027823A1 (en) * 2014-08-20 2016-02-25 住友電装株式会社 Coil manufacturing method and coil manufacturing apparatus
JP2016046863A (en) * 2014-08-20 2016-04-04 住友電装株式会社 Coil manufacturing method and coil manufacturing apparatus
WO2018026367A1 (en) * 2016-08-03 2018-02-08 Hewlett-Packard Development Company, L.P. Conductive wire disposed in a layer
US10933634B2 (en) 2016-08-03 2021-03-02 Hewlett-Packard Development Company, L.P. Conductive wire disposed in a layer

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