JPS55128163A - Method for measurement of resistance of conductive cover - Google Patents

Method for measurement of resistance of conductive cover

Info

Publication number
JPS55128163A
JPS55128163A JP3554079A JP3554079A JPS55128163A JP S55128163 A JPS55128163 A JP S55128163A JP 3554079 A JP3554079 A JP 3554079A JP 3554079 A JP3554079 A JP 3554079A JP S55128163 A JPS55128163 A JP S55128163A
Authority
JP
Japan
Prior art keywords
electrodes
resistance
impedance
high frequency
frequency signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3554079A
Other languages
Japanese (ja)
Inventor
Eiji Sawa
Katsuyoshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP3554079A priority Critical patent/JPS55128163A/en
Publication of JPS55128163A publication Critical patent/JPS55128163A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To determine the resistance of the conductive film by measuring the impedance between a pair of electrodes provided on the one surface of a dielectric through a capacitance combination of the electrodes and the film provided on the other surface thereof with the application of a high frequency signal between the electrodes.
CONSTITUTION: A pair of electrodes 11 and 12 arranged in a loop is provided outside a glass tube 2 as a dielectric and a high frequency signal from a high frequency signal source 13 is applied between the electrodes 11 and 12 to effect a capacitance combination of the conductive film 3 separately with the electrodes 11 and 12. The current i flowing between both the electrodes 11 and 12 is determined with an ammeter 14 to measure the impedance Z. The resistance R of the conductive film 3 attains the level as given by R≈v/i (where, v is the voltage of the power source 13) by increaing the area S of the electrodes 11 and 12, for example, with a larger width a. Thus, the resistance R can be estimated from the impedance Z.
COPYRIGHT: (C)1980,JPO&Japio
JP3554079A 1979-03-28 1979-03-28 Method for measurement of resistance of conductive cover Pending JPS55128163A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3554079A JPS55128163A (en) 1979-03-28 1979-03-28 Method for measurement of resistance of conductive cover

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3554079A JPS55128163A (en) 1979-03-28 1979-03-28 Method for measurement of resistance of conductive cover

Publications (1)

Publication Number Publication Date
JPS55128163A true JPS55128163A (en) 1980-10-03

Family

ID=12444559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3554079A Pending JPS55128163A (en) 1979-03-28 1979-03-28 Method for measurement of resistance of conductive cover

Country Status (1)

Country Link
JP (1) JPS55128163A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57131073A (en) * 1981-02-05 1982-08-13 Matsushita Electronics Corp Device for measuring resistance distribution of transparent conducting film of instantaneously lighting type fluorescent lamp

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57131073A (en) * 1981-02-05 1982-08-13 Matsushita Electronics Corp Device for measuring resistance distribution of transparent conducting film of instantaneously lighting type fluorescent lamp

Similar Documents

Publication Publication Date Title
SE8701033L (en) METHOD AND APPARATUS FOR ANALYZING ELECTRODIMPEDANCE
JPS55155258A (en) Device for measuring characteristic of gapless arrester
JPS55128163A (en) Method for measurement of resistance of conductive cover
JPS5368290A (en) Insulation resistance measuring apparatus of ground system
JPS6469901A (en) Interval measuring apparatus
JPS55146059A (en) Measuring method of dielectric constant and its unit
JPS5579474A (en) Concentration detecting method of developer
JPS57108650A (en) Device for detecting mixing ratio of alcohol and water content ratio
JPS5393072A (en) Earthing resistance measuring apparatus
JPS54147085A (en) Measuring apparatus for degree of vacuum
JPS55144556A (en) Surface potentiometer
JPS5570752A (en) Balancing type partial discharge test circuit
JPS57130346A (en) Instrument for measuring resistance of transparent conductive film of instantly starting fluorescent lamp
JPS5630658A (en) Dielectric strength measuring apparatus
JPS5343482A (en) Leakage current measuring method of semiconductor device
JPS54153700A (en) Discontinuity measuring apparatus of metal surface condition
JPS6463877A (en) Earthing resistance measuring apparatus
JPS5611367A (en) Detecting unit and method for degradation of apparatus using zinc oxide element
JPS5397462A (en) Thrust amount measuring device of rolling horizontal rolls
JPS5580001A (en) Detecting method of uneven thickness of conductive thin film
JPS55149853A (en) Measuring method for crystalline liquid panel actuating current
JPS57131073A (en) Device for measuring resistance distribution of transparent conducting film of instantaneously lighting type fluorescent lamp
JPS53105192A (en) Test equipment for liquid crystal display element
JPS55119064A (en) Surface electrometer
JPS5786747A (en) Measuring method for humidity and dew condensation